Search results
- 1.0399809 - ÚPT 2014 RIV GB eng J - Journal Article
Lazar, Josef - Holá, Miroslava - Číp, Ondřej - Hrabina, Jan - Oulehla, Jindřich
Interferometric system with tracking refractometry capability in the measuring axis.
Measurement Science and Technology. Roč. 24, č. 6 (2013), 067001:1-6. ISSN 0957-0233. E-ISSN 1361-6501
R&D Projects: GA ČR GA102/09/1276; GA ČR GPP102/11/P820; GA TA ČR TE01020233; GA TA ČR TA02010711; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : refractometry * nanopositioning * interferometry * nanometrology
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.352, year: 2013
Permanent Link: http://hdl.handle.net/11104/0227030 - 2.0397701 - ÚPT 2014 RIV SK eng J - Journal Article
Hrabina, Jan - Lazar, Josef - Holá, Miroslava - Číp, Ondřej
Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry.
Measurement Science Review. Roč. 13, č. 2 (2013), s. 63-69. ISSN 1335-8871. E-ISSN 1335-8871
R&D Projects: GA ČR GPP102/11/P820; GA ČR GA102/09/1276; GA AV ČR KAN311610701; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LC06007; GA MŠMT EE2.4.31.0016; GA TA ČR TA02010711
Institutional support: RVO:68081731
Keywords : nanometrology * laser noise * AFM * spectroscopy * interferometry
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.162, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225338 - 3.0389837 - ÚPT 2014 RIV CH eng J - Journal Article
Hrabina, Jan - Lazar, Josef - Holá, Miroslava - Číp, Ondřej
Frequency Noise Properties of Lasers for Interferometry in Nanometrology.
Sensors. Roč. 13, č. 2 (2013), s. 2206-2219. E-ISSN 1424-8220
R&D Projects: GA ČR GPP102/11/P820; GA ČR GA102/09/1276; GA AV ČR KAN311610701; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LC06007
Institutional support: RVO:68081731
Keywords : nanometrology * laser noise * interferometry * nanopositioning * AFM
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 2.048, year: 2013
Permanent Link: http://hdl.handle.net/11104/0218775 - 4.0385756 - ÚPT 2013 RIV CZ cze J - Journal Article
Lazar, Josef - Hrabina, Jan - Šerý, Mojmír - Číp, Ondřej - Čížek, Martin
Laserový systém pro odměřování 3D polohy s nanometrovým rozlišením pro mikroskopy.
[Laser system for measurement of the 3D position with nanometre resolution for microscopes.]
Jemná mechanika a optika. Roč. 57, č. 10 (2012), s. 283-286. ISSN 0447-6441
R&D Projects: GA ČR GA102/09/1276; GA TA ČR TA02010711; GA TA ČR TE01020233; GA MŠMT ED0017/01/01; GA ČR GPP102/11/P820
Institutional support: RVO:68081731
Keywords : coordinate position sensing * nanometrology * 3D position * atomic force microscopy * local probe techniques * electron microscopy
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0215570 - 5.0385287 - ÚPT 2013 RIV CH eng J - Journal Article
Lazar, Josef - Holá, Miroslava - Číp, Ondřej - Čížek, Martin - Hrabina, Jan - Buchta, Zdeněk
Refractive Index Compensation in Over-Determined Interferometric Systems.
Sensors. Roč. 12, č. 10 (2012), s. 14084-14094. E-ISSN 1424-8220
R&D Projects: GA ČR GA102/09/1276; GA ČR GPP102/11/P820; GA TA ČR TA02010711; GA TA ČR TE01020233; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : refractometry * nanopositioning * interferometry * nanometrology
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.953, year: 2012
Permanent Link: http://hdl.handle.net/11104/0214593 - 6.0385285 - ÚPT 2013 RIV US eng J - Journal Article
Lazar, Josef - Holá, Miroslava - Číp, Ondřej - Čížek, Martin - Hrabina, Jan - Buchta, Zdeněk
Displacement interferometry with stabilization of wavelength in air.
Optics Express. Roč. 20, č. 25 (2012), s. 27830-27837. ISSN 1094-4087
R&D Projects: GA ČR GA102/09/1276; GA ČR GPP102/11/P820; GA TA ČR TA02010711; GA TA ČR TE01020233; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : interferometry * instrumentation * measurement, and metrology
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 3.546, year: 2012
Permanent Link: http://hdl.handle.net/11104/0214591 - 7.0372559 - ÚPT 2012 RIV PL eng J - Journal Article
Lazar, Josef - Hrabina, Jan - Šerý, Mojmír - Klapetek, P. - Číp, Ondřej
Multiaxis interferometric displacement measurement for local probe microscopy.
Central European Journal of Physics. Roč. 10, č. 1 (2012), s. 225-231. ISSN 1895-1082
R&D Projects: GA MŠMT(CZ) LC06007; GA AV ČR KAN311610701; GA ČR GA102/09/1276
Institutional research plan: CEZ:AV0Z20650511
Keywords : interferometry * nanometrology * microscopy
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 0.905, year: 2012
Permanent Link: http://hdl.handle.net/11104/0205851 - 8.0368388 - ÚPT 2012 RIV DE eng J - Journal Article
Lazar, Josef - Číp, Ondřej - Čížek, Martin - Hrabina, Jan - Buchta, Zdeněk
Standing Wave Interferometer with Stabilization of Wavelength on Air.
tm-Technisches Messen. Roč. 78, č. 11 (2011), s. 484-488. ISSN 0171-8096
R&D Projects: GA ČR GA102/09/1276; GA ČR GPP102/11/P820; GA AV ČR KAN311610701; GA MŠMT(CZ) LC06007
Institutional research plan: CEZ:AV0Z20650511
Keywords : refractometry * nanopositioning * interferometry * nanometrology
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 0.387, year: 2011
Permanent Link: http://hdl.handle.net/11104/0202748 - 9.0368382 - ÚPT 2012 RIV CH eng J - Journal Article
Lazar, Josef - Číp, Ondřej - Čížek, Martin - Hrabina, Jan - Buchta, Zdeněk
Suppression of Air Refractive Index Variations in High-Resolution Interferometry.
Sensors. Roč. 11, č. 8 (2011), s. 7644-7655. E-ISSN 1424-8220
R&D Projects: GA ČR GA102/09/1276; GA ČR GPP102/11/P820; GA AV ČR KAN311610701; GA MŠMT(CZ) LC06007
Institutional research plan: CEZ:AV0Z20650511
Keywords : refractometry * nanopositioning * interferometry * nanometrology
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.739, year: 2011
Permanent Link: http://hdl.handle.net/11104/0202743 - 10.0366031 - ÚPT 2012 RIV GB eng J - Journal Article
Hrabina, Jan - Lazar, Josef - Klapetek, P. - Číp, Ondřej
Multidimensional interferometric tool for the local probe microscopy nanometrology.
Measurement Science and Technology. Roč. 22, č. 9 (2011), 094030:1-8. ISSN 0957-0233. E-ISSN 1361-6501
R&D Projects: GA MŠMT(CZ) LC06007; GA AV ČR KAN311610701; GA ČR GA102/09/1276
Institutional research plan: CEZ:AV0Z20650511
Keywords : atomic force microscopy (AFM) * nanometrology * nanopositioning interferometry * nanoscale
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.494, year: 2011
Permanent Link: http://hdl.handle.net/11104/0201133