Search results
- 1.0335886 - ÚPT 2010 RIV CZ eng C - Conference Paper (international conference)
Gnieser, D. - Frase, C. G. - Bosse, H. - Konvalina, Ivo - Müllerová, Ilona
Modular Monte Carlo Simulation Including Secondary Electron Raytracing.
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 31-32. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : Monte Carlo simulation * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0180235 - 2.0315460 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš
High-Order Field Derivatives for Computation of Aberrations.
[Vyšší řády derivací pole ve výpočtu aberací.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 95-96. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : aberrations * electron optics
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165657 - 3.0315458 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Matsuda, K. - Frank, Luděk
Low Energy Electron Microscopy in Materials Science.
[Nízko energiová elektronová mikroskopie v materiálových vědách.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 85-86. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : collection efficiency * cathode lens mode * material contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165656 - 4.0315455 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Lencová, Bohumila
Solving Complex Electron Optical Problems with EOD.
[Řešení složitých elektronově optických problémů v EOD.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 65-68. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron optical design * electron mirror * hexapole corrector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165654 - 5.0315454 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Konvalina, Ivo - Hovorka, Miloš - Dvořáková, Marie - Müllerová, Ilona
Signal Collection with Secondary Electron Detectors in SEM.
[Detekce signálu v rastrovacím elektronovém mikroskopu pomocí detektorů sekundárních elektronů.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 61-64. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
R&D Projects: GA AV ČR KJB200650602
Institutional research plan: CEZ:AV0Z20650511
Keywords : secondary electrons * collection efficiency * detectors * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165653 - 6.0315453 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Jánský, Pavel - Lencová, Bohumila - Zlámal, J.
Numerical Simulations of Thermionic Electron Guns.
[Numerické výpočty termoemisních elektronových trysek.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 51-52. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron emission * electron gun * space charge * numerical simulations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165652 - 7.0315452 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Hovorka, Miloš - Mikmeková, Šárka - Frank, Luděk
Scanning Low Energy Electron Microscopy of Doped Silicon at Units of EV.
[Zobrazení dopovaného křemíku na velmi nízkých energiích pomocí rastrovacího elektronového mikroskopu.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 49-50. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : SLEEM * dopant * silicon
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165651 - 8.0315450 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Horáček, Miroslav - Vlček, Ivan - Zobač, Martin
Wien Filter Electron Optical Characteristics Determining Using Shadow Projection Method.
[Měření elektronově-optických vlastností Wienova filtru stínovou metodou.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 47-48. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : Wien filtr * two-grid shadow method * shadow method with grid and moving screen
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165649 - 9.0315449 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Dvořáková, Marie - Mika, Filip
How to Prevent Hydrocarbon Contamination in SEM.
[Prevence tvorby uhlovodíkové kontaminace v SEM.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 29-30. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : contamination * scanning electron microscope * plasma cleaning * Evactron
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165648 - 10.0315445 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Dupák, Libor
Electron Beam Welding: Principles and Applications.
[Svařování elektronovým svazkem: Principy a aplikace.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 27-28. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron beam welding
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165644