Search results

  1. 1.
    0385323 - ÚPT 2013 RIV NL eng J - Journal Article
    Oral, Martin - Radlička, Tomáš - Lencová, B.
    Effect of sample tilt on PEEM resolution.
    Ultramicroscopy. Roč. 119, S1 (2012), s. 45-50. ISSN 0304-3991. E-ISSN 1879-2723
    R&D Projects: GA AV ČR IAA100650805
    Institutional support: RVO:68081731
    Keywords : PEEM * LEEM * Aberrations * Misalignment * Sample tilt * Point spread function * Resolution
    Subject RIV: BH - Optics, Masers, Lasers
    Impact factor: 2.470, year: 2012
    Permanent Link: http://hdl.handle.net/11104/0214610
     
     
  2. 2.
    0358590 - ÚPT 2012 RIV NL eng J - Journal Article
    Oral, Martin - Lencová, Bohumila
    Correction of sample tilt in FIB instruments.
    Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 130-135. ISSN 0168-9002. E-ISSN 1872-9576
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : sample tilt * extraction field * correction of elliptical beam shape * calculation of intensity distribution * focused ion beams
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.207, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0196576
     
     
  3. 3.
    0358560 - ÚPT 2012 RIV NL eng J - Journal Article
    Zlámal, J. - Lencová, Bohumila
    Development of EOD for the design in electron and ion microscopy.
    Nuclear Instruments & Methods in Physics Research Section A. Roč. 654, č. 1 (2011), s. 278-282. ISSN 0168-9002. E-ISSN 1872-9576
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : finite element method * tolerancing * user interface
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.207, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0196559
     
     
  4. 4.
    0350850 - ÚPT 2011 RIV NL eng J - Journal Article
    Radlička, Tomáš - Lencová, Bohumila
    Determination of analytical expansion from numerical field data.
    Ultramicroscopy. Roč. 110, č. 9 (2010), s. 1198-1204. ISSN 0304-3991. E-ISSN 1879-2723
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : electron optics * aberrations * differential algebra method * axial field derivatives
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.061, year: 2010
    Permanent Link: http://hdl.handle.net/11104/0190740
     
     
  5. 5.
    0333616 - ÚPT 2010 RIV GB eng J - Journal Article
    Jánský, Pavel - Zlámal, J. - Lencová, Bohumila - Zobač, Martin - Vlček, Ivan - Radlička, Tomáš
    Numerical simulations of the thermionic electron gun for electron-beam welding and micromachining.
    Vacuum. Roč. 84, č. 2 (2009), s. 357-362. ISSN 0042-207X. E-ISSN 1879-2715
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : Numerical simulation * Thermionic emission * Electron gun
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 0.975, year: 2009
    Permanent Link: http://hdl.handle.net/11104/0178558
     
     
  6. 6.
    0333615 - ÚPT 2010 RIV NL eng J - Journal Article
    Oral, Martin - Lencová, Bohumila
    Calculation of aberration coefficients by ray tracing.
    Ultramicroscopy. Roč. 109, č. 11 (2009), s. 1365-1373. ISSN 0304-3991. E-ISSN 1879-2723
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : Aberrations * Aberration coefficients * Ray tracing * Regression * Fitting
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.067, year: 2009
    Permanent Link: http://hdl.handle.net/11104/0178557
     
     


  This site uses cookies to make them easier to browse. Learn more about how we use cookies.