Search results
- 1.0353047 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Zlámal, J. - Lencová, Bohumila
Accurate and Easy-to-use Electron Optical Design Program for Microscopy.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I1.6:1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : EOD * FEM * Windows
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192397 - 2.0350668 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin
Ray tracing, aberration coefficients and intensity distribution.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 49-52. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : ray tracing * aberration coefficients * intensity distribution
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350668_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190608 - 3.0350661 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Lencová, Bohumila
Recent developments and improvements of EOD program.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 25-28. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : EOD * particle optics
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350661_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190601 - 4.0315453 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Jánský, Pavel - Lencová, Bohumila - Zlámal, J.
Numerical Simulations of Thermionic Electron Guns.
[Numerické výpočty termoemisních elektronových trysek.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 51-52. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron emission * electron gun * space charge * numerical simulations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165652 - 5.0315085 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
Jánský, Pavel - Lencová, Bohumila - Zlámal, J.
Accurate calculations of thermionic electron gun properties.
[Přesné výpočty vlastností termoemisní elektronové trysky.]
EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 557-558. ISBN 978-3-540-85154-7.
[EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron emission * electron gun * space charge
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0004856 - 6.0315084 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
Radlička, Tomáš - Lencová, Bohumila
Influence of tilt of sample on axial beam properties.
[Vliv náklonění vzorku na vlastnosti osového svazku.]
EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 599-600. ISBN 978-3-540-85154-7.
[EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : parasitic aberration * misalignment aberrations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0004855