Search results
- 1.0352423 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Matějka, František - Horáček, Miroslav - Kolařík, Vladimír - Král, Stanislav
Modification of the Schottky FE ZrO/W electron emitter.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I1.12: 1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA AV ČR IAA100650803; GA MPO FR-TI1/576; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : e-beam writing system * rectangular-shaped electron beam * point projection
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191931 - 2.0350672 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Zobačová, Jitka - Mikmeková, Šárka - Polčák, J. - Frank, Luděk
Imaging of thermal treated thin films on silicon substrate in the scanning low energy electron microscope.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 69-70. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : thin films * SLEEM * Si substrate
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350672_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190612 - 3.0350658 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk
Mapping of dopants by electron injection.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 15-16. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA ČR GP102/09/P543; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : silicon structures * secondary electron emission * very low energy range * mapping dopants
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350658_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190598 - 4.0350657 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Matějka, František - Horáček, Miroslav - Kolařík, Vladimír - Král, Stanislav
Modification of the Schottky Fe ZrO/W electron emitter.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 13-14. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650803; GA MPO FR-TI1/576; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : Schottky electron emitter * e-beam writing system * point projection
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350657_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190597 - 5.0335293 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Hovorka, Miloš - Mika, Filip - Frank, Luděk - Mikulík, P.
Profiling of N-Type Dopants in Silicon Based Structures.
Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009 - (Pokorná, Z.; Mika, F.), s. 14. ISBN 978-80-254-4535-8.
[CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./. Brno (CZ), 10.08.2009-14.08.2009]
R&D Projects: GA ČR GP102/09/P543; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : n-type substrate * SEM * PEEM * doping levels
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0179799 - 6.0335265 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Horáček, Miroslav - Zobač, Martin - Vlček, Ivan
Electron beam induced current measurement on a specimen biased in a cathode lens.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 211-212. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : elektron beam induced current * SEM * very low energy electrons * cathode lens * specimen bias
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/77645.pdf
Permanent Link: http://hdl.handle.net/11104/0179775 - 7.0335263 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Mika, Filip - Hovorka, Miloš - Frank, Luděk
Secondary electron contrast in doped semiconductor with presence of a surface ad-layer.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 199-200. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
R&D Projects: GA ČR GP102/09/P543; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : dopant contrast * secondary electrons * semiconductor
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/51426.pdf
Permanent Link: http://hdl.handle.net/11104/0179773 - 8.0335261 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Hovorka, Miloš - Mika, Filip - Frank, Luděk
Profiling of N-type dopants in silicon structures.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 181-182. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
R&D Projects: GA ČR GP102/09/P543; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : silicon * dopants * PEEM * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/19923.pdf
Permanent Link: http://hdl.handle.net/11104/0179772 - 9.0315452 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Hovorka, Miloš - Mikmeková, Šárka - Frank, Luděk
Scanning Low Energy Electron Microscopy of Doped Silicon at Units of EV.
[Zobrazení dopovaného křemíku na velmi nízkých energiích pomocí rastrovacího elektronového mikroskopu.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 49-50. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : SLEEM * dopant * silicon
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165651 - 10.0315450 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Horáček, Miroslav - Vlček, Ivan - Zobač, Martin
Wien Filter Electron Optical Characteristics Determining Using Shadow Projection Method.
[Měření elektronově-optických vlastností Wienova filtru stínovou metodou.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 47-48. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : Wien filtr * two-grid shadow method * shadow method with grid and moving screen
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165649