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- 1.0424817 - FZÚ 2014 RIV GB eng J - Journal Article
Wadley, P. - Crespi, A. - Gazquez, J. - Roldan, M.A. - Garcia, P. - Novák, Vít - Campion, R. - Jungwirth, Tomáš - Rinaldi, C. - Martí, Xavier - Holy, V. - Frontera, C. - Rius, J.
Obtaining the structure factors for an epitaxial film using Cu X-ray radiation.
Journal of Applied Crystallography. Roč. 46, č. 6 (2013), s. 1749-1754. ISSN 0021-8898. E-ISSN 1600-5767
R&D Projects: GA MŠMT(CZ) LM2011026
EU Projects: European Commission(XE) 268066 - 0MSPIN
Grant - others:AV ČR(CZ) AP0801
Program: Akademická prémie - Praemium Academiae
Institutional support: RVO:68378271
Keywords : crystal structure * thin films * antiferromagnets
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.950, year: 2013
Permanent Link: http://hdl.handle.net/11104/0230829