0328405 - ÚMCH 2010 US eng C - Conference Paper (international conference)
Wágner, T. - Gutwirth, J. - Orava, J. - Přikryl, J. - Bezdička, Petr - Bartoš, M. - Vlček, Milan - Frumar, M.Characterization of RF magnetron sputtered Se-doped Ge2Sb2.3Te5 thin films.
Phase-Change Materials for Reconfigurable Electronics and Memory Applications. Warrendale: Materials Research Society, 2008 - (Edwards, A.; Fons, P.; Raoux, S.; Taylor, P.; Taylor, M.), G05-07/1-G05-07/6. 1072. ISBN N.
[Spring Meeting MRS - Phase-Change Materials for Reconfigurable Electronics and Memory Applications. San Francisco (US), 24.03.2008-27.03.2008]
R&D Projects: GA ČR GA203/06/1368; GA ČR GA203/06/0627; GA MŠMT LC523
Institutional research plan: CEZ:AV0Z40320502; CEZ:AV0Z40500505
Keywords : RF magnetron sputtering technique
Subject RIV: CA - Inorganic Chemistry
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Permanent Link: http://hdl.handle.net/11104/0174727