Search results
- 1.0502418 - FZÚ 2019 RIV US eng J - Journal Article
Krzywinski, J. - Andrejczuk, A. - Bionta, R.M. - Burian, Tomáš - Chalupský, Jaromír - Jurek, M. - Kirm, M. - Nagirnyi, V. - Sobierajski, R. - Tiedtke, K. - Vielhauer, S. - Juha, Libor
Saturation of a Ce:Y3Al5O12 scintillator response to ultra-short pulses of extreme ultraviolet soft X-ray and X-ray laser radiation.
Optical Materials Express. Roč. 7, č. 3 (2017), s. 665-675. ISSN 2159-3930
R&D Projects: GA MŠMT(CZ) LH14072; GA MŠMT LG15013; GA ČR(CZ) GA14-29772S
Institutional support: RVO:68378271
Keywords : fluorescent and luminescent materials * luminescence * free-electron lasers (FELs) * UV * EUV * X-ray lasers * laser beam characterization * radiometr
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 2.566, year: 2017
Permanent Link: http://hdl.handle.net/11104/0294353 - 2.0334092 - FZÚ 2010 RIV US eng J - Journal Article
Hau-Riege, S.P. - London, R.A. - Bionta, R.M. - Ryutov, D. - Soufli, R. - Bajt, S. - McKernan, M.A. - Baker, S. L. - Krzywinski, J. - Sobierajski, R. - Nietubyc, R. - Klinger, D. - Pelka, J. B. - Jurek, M. - Juha, Libor - Chalupský, Jaromír - Cihelka, Jaroslav - Hájková, Věra - Velyhan, Andriy - Krása, Josef - Tiedtke, K. - Toleikis, S. - Wabnitz, H. - Bergh, M. - Caleman, C. - Timneanu, N.
Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation.
[Závislost prahu poškození anorganických materiálů ozářených XUV laserem s volnými elektrony.]
Applied Physics Letters. Roč. 95, č. 11 (2009), 111104/1-111104/3. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA AV ČR KAN300100702; GA MŠMT LC510; GA MŠMT(CZ) LC528; GA MŠMT LA08024; GA AV ČR IAA400100701
Institutional research plan: CEZ:AV0Z10100523
Keywords : damage threshold * silicon carbide * boron carbide * soft X-ray free-electron laser
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 3.554, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178918 - 3.0086012 - FZÚ 2008 RIV US eng J - Journal Article
Hau-Riege, S.P. - London, R.A. - Bionta, R.M. - McKernan, M.A. - Baker, S. L. - Krzywinski, J. - Sobierajski, R. - Nietubyc, R. - Pelka, J. B. - Jurek, M. - Juha, Libor - Chalupský, Jaromír - Cihelka, Jaroslav - Hájková, Věra - Velyhan, Andriy - Krása, Josef - Kuba, J. - Tiedtke, K. - Toleikis, S. - Tschentscher, T. - Wabnitz, H. - Bergh, M. - Caleman, C. - Sokolowski-Tinten, K. - Stojanovic, N. - Zastrau, U.
Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength.
[Prahy poškození anorganických pevných látek ozářených laserem s volnými elektrony na vlnové délce 32,5 nm.]
Applied Physics Letters. Roč. 90, č. 17 (2007), 173128/1-173128/3. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA MŠMT 1P04LA235; GA MŠMT LC510; GA MŠMT(CZ) LC528; GA AV ČR KAN300100702
Grant - others:European Commission(XE) RII-CT-2004-506008, IA-SFS; GA MŠk(CZ) 1K05026
Institutional research plan: CEZ:AV0Z10100523; CEZ:AV0Z40400503
Keywords : free-electron laser, * soft X-rays * damage threshold, * laser-matter interaction * ablation
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 3.596, year: 2007
Permanent Link: http://hdl.handle.net/11104/0148390 - 4.0086002 - FZÚ 2008 RIV US eng J - Journal Article
Chalupský, Jaromír - Juha, Libor - Kuba, J. - Cihelka, Jaroslav - Hájková, Věra - Koptyaev, Sergey - Krása, Josef - Velyhan, Andriy - Bergh, M. - Caleman, C. - Hajdu, J. - Bionta, R.M. - Chapman, H. - Hau-Riege, S.P. - London, R.A. - Jurek, M. - Krzywinski, J. - Nietubyc, R. - Pelka, J. B. - Sobierajski, R. - Meyer-ter-Vehn, J. - Tronnier, A. - Sokolowski-Tinten, K. - Stojanovic, N. - Tiedtke, K. - Toleikis, S. - Tschentscher, T. - Wabnitz, H. - Zastrau, U.
Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids.
[Stanovení charakteristik fokusovaného svazku rentgenového laseru s volnými elektrony pomocí ablace organických molekulárních materiálů.]
Optics Express. Roč. 15, č. 10 (2007), s. 6036-6042. ISSN 1094-4087
R&D Projects: GA MŠMT 1P04LA235; GA MŠMT LC510; GA MŠMT(CZ) LC528; GA AV ČR KAN300100702
Grant - others:GA MŠk(CZ) 1K05026
Institutional research plan: CEZ:AV0Z10100523; CEZ:AV0Z40400503
Keywords : free-electron laser * soft X-rays * focusing * beam profile * ablation threshold * laser-matter interaction
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 3.709, year: 2007
Permanent Link: http://hdl.handle.net/11104/0148382