Search results
- 1.0536670 - ÚPT 2021 RIV CZ cze O - Others
Krátký, Stanislav - Materna Mikmeková, Eliška - Fořt, Tomáš - Radlička, Tomáš - Sháněl, O.
Vývoj a testování fázových destiček.
[Development and testing of phase plates.]
2020
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : transmission electron microscope * phase plates * silicon nitride * charging * EELS
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314406 - 2.0536669 - ÚPT 2021 RIV CZ cze O - Others
Radlička, Tomáš - Sháněl, O.
Optimalizace zobrazení pro HR-STEM.
[HR-STEM imaging optimization.]
2020
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning transmission electron microscope * Ronchigram * aberration analysis 9) Hlavní obor smluvního výzkumu dle číselníku CEP (RIV)
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314405 - 3.0536668 - ÚPT 2021 RIV CZ cze O - Others
Radlička, Tomáš - Sháněl, O.
Optimalizační algoritmus pro HR-STEM s nekorigovanou sférickou vadou.
[HR-STEM optimizing algorithm for Cs non-corrected TEM.]
2020
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning transmission electron microscope * Ronchigram * aberration analysis
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314404 - 4.0536667 - ÚPT 2021 RIV CZ cze O - Others
Radlička, Tomáš - Oral, Martin - Řiháček, Tomáš - Seďa, B. - Vašina, R.
Variabilní objektivová čočka.
[Variable objective lens.]
2020
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning electron microscope * variable objective lens * secondary * secondary electrons * resolution
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314403 - 5.0536666 - ÚPT 2021 RIV CZ cze O - Others
Radlička, Tomáš - Oral, Martin - Řiháček, Tomáš - Seďa, B. - Vašina, R.
Anulární apertury pro skenovací elektronový mikroskop.
[Annular aperture for Scanning electron microscope.]
2020
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : annular aperture * scanning electron microscopy * resolution * denoising
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314402