Search results

  1. 1.
    0536670 - ÚPT 2021 RIV CZ cze O - Others
    Krátký, Stanislav - Materna Mikmeková, Eliška - Fořt, Tomáš - Radlička, Tomáš - Sháněl, O.
    Vývoj a testování fázových destiček.
    [Development and testing of phase plates.]
    2020
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : transmission electron microscope * phase plates * silicon nitride * charging * EELS
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0314406
     
     
  2. 2.
    0536669 - ÚPT 2021 RIV CZ cze O - Others
    Radlička, Tomáš - Sháněl, O.
    Optimalizace zobrazení pro HR-STEM.
    [HR-STEM imaging optimization.]
    2020
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : scanning transmission electron microscope * Ronchigram * aberration analysis 9) Hlavní obor smluvního výzkumu dle číselníku CEP (RIV)
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0314405
     
     
  3. 3.
    0536668 - ÚPT 2021 RIV CZ cze O - Others
    Radlička, Tomáš - Sháněl, O.
    Optimalizační algoritmus pro HR-STEM s nekorigovanou sférickou vadou.
    [HR-STEM optimizing algorithm for Cs non-corrected TEM.]
    2020
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : scanning transmission electron microscope * Ronchigram * aberration analysis
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0314404
     
     
  4. 4.
    0536667 - ÚPT 2021 RIV CZ cze O - Others
    Radlička, Tomáš - Oral, Martin - Řiháček, Tomáš - Seďa, B. - Vašina, R.
    Variabilní objektivová čočka.
    [Variable objective lens.]
    2020
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : scanning electron microscope * variable objective lens * secondary * secondary electrons * resolution
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0314403
     
     
  5. 5.
    0536666 - ÚPT 2021 RIV CZ cze O - Others
    Radlička, Tomáš - Oral, Martin - Řiháček, Tomáš - Seďa, B. - Vašina, R.
    Anulární apertury pro skenovací elektronový mikroskop.
    [Annular aperture for Scanning electron microscope.]
    2020
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : annular aperture * scanning electron microscopy * resolution * denoising
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0314402
     
     


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