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  1. 1.
    0308154 - ÚPT 2008 RIV US eng M - Monography Chapter
    Radlička, Tomáš
    Lie Algebraic method in Charged Particle Optics.
    [Metody Lieových algeber v optice nabitých částic.]
    Advances in Imaging and Electron Physics, Vol. 151. San Diego: Academic Press - Elsevier, 2008 - (Hawkes, P.), s. 241-362. ISBN 978-0-12-374218-6
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : aberrations * Lie algebra method
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0160719
     
     


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