Search results
- 1.0049023 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Wandrol, Petr - Müllerová, Ilona
Detection of Signal Electrons in the Low Voltage SEM.
[Detekce signálních elektronů v nízkonapěťové SEM.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 71-72. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA AV ČR KJB200650501
Institutional research plan: CEZ:AV0Z20650511
Keywords : signal electrons * detection * low voltage SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139520 - 2.0049022 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Schauer, Petr
Decay Kinetics of Scintillation Crystals for SEM Electron Detectors.
[Kinetika doznívání scintilačních krystalů pro detektory elektronů v SEM.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 63-64. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA102/04/2144
Institutional research plan: CEZ:AV0Z20650511
Keywords : scintillation detector * electron microscope * cathodoluminescence * YAG:Ce * single crystal scintillator * decay time * afterglow * kinetic model * SEM * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139519 - 3.0049021 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš
Coulomb Interaction in Ion and Electron Beams.
[Coulombovské interakce v iontových a elektronových svazcích.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 61-62. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA102/05/2325
Institutional research plan: CEZ:AV0Z20650511
Keywords : Coulomb interaction * LMIS * lithography
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139518 - 4.0049020 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk
Methods of Direct Imaging of the Local Density of States with Electrons.
[Metody přímého zobrazování hustoty stavů pomocí elektronů.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 59-60. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : local density of states * image contrast * electron reflectivity * very low energy electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139517 - 5.0049019 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Novák, Libor - Müllerová, Ilona
Processing of Signal in the Everhart-Thornley Detector.
[Zpracování signálu Everhart-Thornleyho detektorem.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 57-58. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA102/04/2144
Institutional research plan: CEZ:AV0Z20650511
Keywords : SEM * detection * Everhart-Thornley
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139516 - 6.0049018 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Neděla, Vilém - Maxa, J. - Autrata, Rudolf
Environmental Scanning Electron Microscope AQUASEM II - The Design and Applications.
[Environmentální rastrovací elektronový mikroskop AQUASEM-II - návrh a aplikace.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 55-56. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR(CZ) GA102/05/0886; GA AV ČR KJB200650602
Institutional research plan: CEZ:AV0Z20650511
Keywords : ESEM * AQUASEM-II * design
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139515 - 7.0049017 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona
Cathode Lens Mode in the Scanning Electron Microscope.
[Režim katodové čočky v rastrovacím elektronovém mikroskopu.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 49-52. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : cathode lens mode * SEM * very slow electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139514 - 8.0049016 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Mika, Filip - Frank, Luděk
Imaging of Dopants in Semiconductors with the Secondary Electrons in a Low Energy SEM.
[Zobrazení dopantu v polovodiči s pomocí sekundárních elektronů v LESEM.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 47-48. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
Institutional research plan: CEZ:AV0Z20650511
Keywords : dopant distribution profile * low energy scanning electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139513 - 9.0049015 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Lencová, Bohumila - Zlámal, Jakub
EOD (Electron Optical Design) Program Features.
[Vlastnosti programu EOD (Electron Optical Design).]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 45-46. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
Institutional research plan: CEZ:AV0Z20650511
Keywords : optics of charged particles * design of electron microscopes * user inetrface * numerical methods of ray tracing * the finite element method
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139512 - 10.0049014 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Lencová, Bohumila - Oral, Martin
Programs for Electron Optical Design.
[Programy pro elektronově optický návrh.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 41-44. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
Institutional research plan: CEZ:AV0Z20650511
Keywords : optics of charged particles * computation of spot profiles * scanning electron microscope design * Wien filter
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139511