Search results
- 1.0347839 - FZÚ 2011 RIV DE eng J - Journal Article
Bronsveld, P.C.P. - Mates, Tomáš - Fejfar, Antonín - Kočka, Jan - Rath, J.K. - Schropp, R.E.I.
High hydrogen dilution and low substrate temperature cause columnar growth of hydrogenated amorphous silicon.
Physica Status Solidi A. Roč. 207, č. 3 (2010), s. 525-529. ISSN 1862-6300. E-ISSN 1862-6319
R&D Projects: GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510
Institutional research plan: CEZ:AV0Z10100521
Keywords : hydrogenated amorphous silicon * columnar growth * cross-sectional transmission electron microscope (X-TEM]
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.458, year: 2010
http://dx.doi.org/10.1002/pssa.200982847
Permanent Link: http://hdl.handle.net/11104/0188523 - 2.0341955 - FZÚ 2010 RIV GB eng J - Journal Article
Mates, Tomáš - Bronsveld, P.C.P. - Fejfar, Antonín - Rezek, Bohuslav - Kočka, Jan - Rath, J.K. - Schropp, R.E.I.
Structure of mixed-phase Si films studied by C-AFM and X-TEM.
[Struktura smíšené fáze tenkých křemíkových vrstev studovaná pomocí vodivostního AFM a průřezového TEM.]
Journal of Physics: Conference Series. Roč. 61, - (2007), s. 790-794. ISSN 1742-6588. E-ISSN 1742-6596
R&D Projects: GA MŽP(CZ) SN/3/172/05
Keywords : microcrystalline silicon * conductive AFM * cross-sectional TEM
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0184793 - 3.0341951 - FZÚ 2010 RIV DE eng J - Journal Article
Mates, Tomáš - Fejfar, Antonín - Rezek, Bohuslav - Kočka, Jan - Bronsveld, P.C.P. - Rath, J.K. - Schropp, R.E.I.
C-AFM and X-TEM: studies of mixed-phase silicon thin films.
[C-AFM a X-TEM: zkoumání heterostrukturních tenkých vrstev křemíku.]
G.I.T. Imaging and Microscopy. Roč. 10, č. 1 (2008), s. 30-32. ISSN 1439-4243
R&D Projects: GA MŽP(CZ) SN/3/172/05
Keywords : conductive atomic force microscopy * cross-sectional transmission electron microscopy * silicon thin films
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0184790 - 4.0308068 - FZÚ 2008 RIV DE eng J - Journal Article
Mates, Tomáš - Fejfar, Antonín - Rezek, Bohuslav - Kočka, Jan - Bronsveld, P.C.P. - Rath, J.K. - Schropp, R.E.I.
C-AFM and X-TEM: studies of mixed-phase silicon thin films.
[C-AFM a X-TEM: zkoumání heterostrukturních tenkých vrstev křemíku.]
G.I.T. Imaging and Microscopy. Roč. 10, č. 1 (2008), s. 30-32. ISSN 1439-4243
R&D Projects: GA MŠMT(CZ) LC06040; GA MŽP(CZ) SN/3/172/05; GA ČR(CZ) GD202/05/H003; GA AV ČR IAA1010316; GA MŠMT LC510; GA AV ČR IAA1010413
Institutional research plan: CEZ:AV0Z10100521
Keywords : conductive atomic force microscopy * cross-sectional transmission electron microscopy * silicon thin films
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0160655 - 5.0087819 - FZÚ 2008 RIV GB eng J - Journal Article
Mates, Tomáš - Bronsveld, P.C.P. - Fejfar, Antonín - Rezek, Bohuslav - Kočka, Jan - Rath, J.K. - Schropp, R.E.I.
Structure of mixed-phase Si films studied by C-AFM and X-TEM.
[Struktura smíšené fáze tenkých křemíkových vrstev studovaná pomocí vodivostního AFM a průřezového TEM.]
Journal of Physics: Conference Series. Roč. 61, - (2007), s. 790-794. ISSN 1742-6588. E-ISSN 1742-6596
R&D Projects: GA MŠMT LC510; GA MŠMT(CZ) LC06040; GA MŽP(CZ) SN/3/172/05; GA AV ČR IAA1010316; GA AV ČR IAA1010413; GA ČR(CZ) GD202/05/H003
Institutional research plan: CEZ:AV0Z10100521
Keywords : microcrystalline silicon * conductive AFM * cross-sectional TEM
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0149563 - 6.0041137 - FZÚ 2007 RIV US eng J - Journal Article
Bronsveld, P.C.P. - Rath, J.K. - Schropp, R.E.I. - Mates, Tomáš - Fejfar, Antonín - Rezek, Bohuslav - Kočka, Jan
Internal structure of mixed phase hydrogenated silicon thin films made at 39 degrees.
[Vnitřní struktura hydrogenovaných křemíkových vrstev se smíšenou fází připravených při 39 st. Celsia.]
Applied Physics Letters. Roč. 89, - (2006), 051922/1-051922/3. ISSN 0003-6951. E-ISSN 1077-3118
Institutional research plan: CEZ:AV0Z10100521
Keywords : transmission electron microscope * atomic force microscope * silicon films
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.977, year: 2006
Permanent Link: http://hdl.handle.net/11104/0134706 - 7.0040682 - FZÚ 2007 RIV NL eng J - Journal Article
Mates, Tomáš - Bronsveld, P.C.P. - Fejfar, Antonín - Rezek, Bohuslav - Kočka, Jan - Rath, J.K. - Schropp, R.E.I.
Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM.
[Detailní studium struktury nízkoteplotních Si vrstev se smíšenou strukturou pomocí X-TEM a atmosférického vodivostního AFM.]
Journal of Non-Crystalline Solids. Roč. 352, - (2006), s. 1011-1015. ISSN 0022-3093. E-ISSN 1873-4812
R&D Projects: GA MŽP(CZ) SN/3/172/05; GA AV ČR(CZ) IAA1010316; GA AV ČR(CZ) IAA1010413; GA ČR(CZ) GD202/05/H003
Institutional research plan: CEZ:AV0Z10100521
Keywords : silicon * solar cells * plasma deposition * atomic force and scanning tunneling microscopy * TEM/STEM
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.362, year: 2006
Permanent Link: http://hdl.handle.net/11104/0134348