Search results
- 1.0474926 - FZÚ 2018 RIV GB eng J - Journal Article
Onoda, J. - Ondráček, Martin - Jelínek, Pavel - Sugimoto, Y.
Electronegativity determination of individual surface atoms by atomic force microscopy.
Nature Communications. Roč. 8, Apr (2017), 1-6, č. článku 15155. E-ISSN 2041-1723
R&D Projects: GA ČR(CZ) GC14-16963J
Grant - others:AV ČR(CZ) AP1601
Program: Akademická prémie - Praemium Academiae
Institutional support: RVO:68378271
Keywords : AFM * DFT * electronegativity * surface science
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 12.353, year: 2017
Permanent Link: http://hdl.handle.net/11104/0271827File Download Size Commentary Version Access 0474926.pdf 4 639.9 KB CC licence Publisher’s postprint open-access - 2.0456404 - FZÚ 2016 RIV US eng J - Journal Article
Yamazaki, S. - Maeda, K. - Sugimoto, Y. - Abe, M. - Zobač, Vladimír - Pou, P. - Rodrigo, L. - Mutombo, Pingo - Perez, R. - Jelínek, Pavel - Morita, S.
Interplay between switching driven by the tunneling current andatomic force of a bistable four-atom Si quantum dot.
Nano Letters. Roč. 15, č. 7 (2015), 4356-4363. ISSN 1530-6984. E-ISSN 1530-6992
R&D Projects: GA ČR(CZ) GA14-02079S
Institutional support: RVO:68378271
Keywords : atomic manipulation * atomic switch * Si quantum dot * scanning tunneling microscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 13.779, year: 2015
Permanent Link: http://hdl.handle.net/11104/0256930 - 3.0456389 - FZÚ 2016 RIV GB eng J - Journal Article
Iwata, K. - Yamazaki, S. - Mutombo, Pingo - Hapala, Prokop - Ondráček, Martin - Jelínek, Pavel - Sugimoto, Y.
Chemical structure imaging of a single molecule by atomic force microscopy at room temperature.
Nature Communications. Roč. 6, Jul (2015), s. 7766. E-ISSN 2041-1723
R&D Projects: GA ČR(CZ) GC14-16963J
Institutional support: RVO:68378271
Keywords : nc AFM * PTCDA * DFT
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 11.329, year: 2015
Permanent Link: http://hdl.handle.net/11104/0256927File Download Size Commentary Version Access 0456389.pdf 16 27.6 MB CC licence Publisher’s postprint open-access - 4.0432274 - FZÚ 2015 RIV US eng J - Journal Article
Onoda, J. - Ondráček, Martin - Yurtsever, A. - Jelínek, Pavel - Sugimoto, Y.
Initial and secondary oxidation products on the Si(111)-(7x7) surface identified by atomic force microscopy and first principles calculations.
Applied Physics Letters. Roč. 104, č. 13 (2014), "133107-1"-"133107-4". ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA ČR(CZ) GA14-02079S
Grant - others:AVČR(CZ) M100101207
Institutional support: RVO:68378271
Keywords : silicon surface * oxidation * atomic force microscopy * scanning tunneling microscopy * first principles calculations
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.302, year: 2014
Permanent Link: http://hdl.handle.net/11104/0236696 - 5.0399920 - FZÚ 2014 RIV US eng J - Journal Article
Yurtsever, A. - Sugimoto, Y. - Tanaka, H. - Abe, M. - Morita, S. - Ondráček, Martin - Pou, P. - Pérez, R. - Jelínek, Pavel
Force mapping on a partially H-covered Si(111)-(7x7) surface: Influence of tip and surface reactivity.
Physical Review. B. Roč. 87, č. 15 (2013), "155403-1"-"155403-10". ISSN 1098-0121. E-ISSN 2469-9969
R&D Projects: GA ČR(CZ) GPP204/11/P578; GA ČR GAP204/10/0952; GA AV ČR IAA100100905
Grant - others:GA AV ČR(CZ) M100101207
Institutional support: RVO:68378271
Keywords : atomic force microscopy * DFT simulations * silicon surface * surface passivation * electrostatic interaction
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.664, year: 2013
http://link.aps.org/doi/10.1103/PhysRevB.87.155403
Permanent Link: http://hdl.handle.net/11104/0227067 - 6.0399906 - FZÚ 2014 RIV US eng J - Journal Article
Sugimoto, Y. - Yurtsever, A. - Abe, M. - Morita, S. - Ondráček, Martin - Pou, P. - Perez, R. - Jelínek, Pavel
Role of tip chemical reactivity on atom manipulation process in dynamic force microscopy.
ACS Nano. Roč. 7, č. 8 (2013), s. 7370-7376. ISSN 1936-0851. E-ISSN 1936-086X
R&D Projects: GA ČR(CZ) GPP204/11/P578
Grant - others:GA AV ČR(CZ) M100101207
Institutional support: RVO:68378271
Keywords : noncontact atomic force microscopy * atomic manipulation * force spectroscopy * chemical interaction force * DFT simulations * nudged elastic band
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 12.033, year: 2013
http://pubs.acs.org/doi/abs/10.1021/nn403097p
Permanent Link: http://hdl.handle.net/11104/0227065 - 7.0399566 - FZÚ 2014 RIV US eng J - Journal Article
Sugimoto, Y. - Ondráček, Martin - Abe, M. - Pou, P. - Morita, S. - Perez, R. - Flores, F. - Jelínek, Pavel
Quantum degeneracy in atomic point contacts revealed by chemical force and conductance.
Physical Review Letters. Roč. 111, č. 10 (2013), "106803-1"-"106803-5". ISSN 0031-9007. E-ISSN 1079-7114
R&D Projects: GA ČR(CZ) GPP204/11/P578
Grant - others:GA AV ČR(CZ) M100101207
Institutional support: RVO:68378271
Keywords : scanning tunneling microscopy * atomic force microscopy * degenerate states * silicon surface * dangling bonds
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 7.728, year: 2013
Permanent Link: http://hdl.handle.net/11104/0226828 - 8.0386566 - FZÚ 2013 RIV US eng J - Journal Article
Yurtsever, A. - Fernandez-Torre, D. - González, C. - Jelínek, Pavel - Pou, P. - Sugimoto, Y. - Abe, M. - Pérez, R. - Morita, S.
Understanding image contrast formation in TiO2 with force spectroscopy.
Physical Review. B. Roč. 85, č. 12 (2012), "125416-1"-"125416-9". ISSN 1098-0121. E-ISSN 2469-9969
R&D Projects: GA MŠMT(CZ) ME10076
Institutional research plan: CEZ:AV0Z10100521
Keywords : DFT * AFM * force spectroscopy * atomic resolution
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.767, year: 2012
Permanent Link: http://hdl.handle.net/11104/0215860 - 9.0339531 - FZÚ 2010 RIV US eng J - Journal Article
Sadewasser, S. - Jelínek, Pavel - Fang, Ch.-K. - Custance, Ó. - Yamada, Y. - Sugimoto, Y. - Abe, M. - Morita, S.
New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.
Physical Review Letters. Roč. 103, č. 26 (2009), 266103/1-266103/4. ISSN 0031-9007. E-ISSN 1079-7114
R&D Projects: GA ČR GA202/09/0545; GA AV ČR IAA100100905
Institutional research plan: CEZ:AV0Z10100521
Keywords : KPFM * atomic force microscopy * DFT * atomic resolution * semiconductor surface
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 7.328, year: 2009
Permanent Link: http://hdl.handle.net/11104/0183034 - 10.0316218 - FZÚ 2009 RIV US eng J - Journal Article
Sugimoto, Y. - Pou, P. - Custance, Ó. - Jelínek, Pavel - Abe, M. - Perez, R. - Morita, S.
Complex patterning by vertical interchange atom manipulation using atomic force microscopy.
[Komplexní vzorkování pomocí vertikální výměnné manipulace atomu pomocí mikroskopu atomárních sil.]
Science. Roč. 322, č. 5900 (2008), 413-417. ISSN 0036-8075. E-ISSN 1095-9203
R&D Projects: GA AV ČR IAA1010413
Institutional research plan: CEZ:AV0Z10100521
Keywords : AFM * atomic manipulation * DFT simulation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 28.103, year: 2008
Permanent Link: http://hdl.handle.net/11104/0166209