Search results
- 1.0377299 - FZÚ 2013 RIV SK eng C - Conference Paper (international conference)
Hulicius, Eduard - Vaniš, Jan - Pangrác, Jiří - Walachová, Jarmila - Vyskočil, Jan - Oswald, Jiří - Hospodková, Alice
Direct measurement of quantum levels in InAs/GaAs QDs by BEEM / BEES.
17th Conference of Czech and Slovak Physicists Proceedings. Košice: Slovak Physical Society, 2012 - (Reiffers, M.), s. 105-107. ISBN 978-80-970625-4-5.
[Conference of Czech and Slovak Physicists/17./. Žilina (SK), 05.09.2011-08.09.2011]
R&D Projects: GA ČR GAP102/10/1201; GA ČR GA202/09/0676
Institutional research plan: CEZ:AV0Z10100521; CEZ:AV0Z20670512
Keywords : quantum dots * InAs * GaAs * MOVPE * BEEM * BEES
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0209496 - 2.0367158 - FZÚ 2012 RIV PL eng C - Conference Paper (international conference)
Hulicius, Eduard - Vaniš, Jan - Pangrác, Jiří - Walachová, Jarmila - Vyskočil, Jan - Oswald, Jiří - Hospodková, Alice
Preparation of InAs/GaAs quantum dots for BEEM/BEES.
EWMOVPE XIV. Wroclaw: Printing house of Wroclaw University of Technology, 2011 - (Prazmowska, J.), s. 263-266. ISBN 978-83-7493-599-9.
[European Workshop on Metalorganic Vapor Phase Epitaxy /14./. Wrocław (PL), 05.06.2011-08.06.2011]
R&D Projects: GA ČR GAP102/10/1201; GA ČR GA202/09/0676; GA ČR GPP102/11/P824
Institutional research plan: CEZ:AV0Z10100521; CEZ:AV0Z20670512
Keywords : InAs/GaAs * quantum dots * BEEM/BEES
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0006668 - 3.0304241 - URE-Y 20030134 RIV CZ eng C - Conference Paper (international conference)
Vaniš, Jan - Henini, M. - Šroubek, Filip - Walachová, Jarmila
Preliminary balistic electron emission microscopy/spectroscopy characterization of InAs quantum dots in AlGaAs/GaAs heterostructure.
Brno: Vysoké učení technické, Fakulta strojního inženýrství, 2003. ISBN 80-214-2486-9. In: International Conference NANO'03. Proceedings. - (Šandera, P.), s. 76-80
[NANO'03. Brno (CZ), 21.10.2003-23.10.2003 (K)]
R&D Projects: GA AV ČR KSK1010104 Projekt 04/01:4045
Institutional research plan: CEZ:AV0Z2067918
Keywords : materials * measurement * electro-optical devices * quantum well devices * spectroscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0114381 - 4.0304240 - URE-Y 20030140 RIV CZ eng C - Conference Paper (international conference)
Pavelka, Martin - Zeipl, Radek - Jelínek, Miroslav - Walachová, Jarmila - Studnička, Václav
Annealing of Bi2Te3 thin films prepared by pulsed laser deposition.
Brno: Vysoké učení technické, Fakulta strojního inženýrství, 2003. ISBN 80-214-2486-9. In: International Conference NANO'03. Proceedings. - (Šandera, P.), s. 104-108
[NANO'03. Brno (CZ), 21.10.2003-23.10.2003 (K)]
R&D Projects: GA ČR GA202/02/0098; GA AV ČR IAA1010110
Institutional research plan: CEZ:AV0Z2067918
Keywords : thin films * thermoelectricity
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0114380 - 5.0304238 - URE-Y 20030128 RIV CZ eng C - Conference Paper (international conference)
Zeipl, Radek - Pavelka, Martin - Jelínek, Miroslav - Vaniš, Jan - Šroubek, Filip - Walachová, Jarmila
Modification of Bi2Te3 nanolayers.
Brno: Vysoké učení technické, Fakulta strojního inženýrství, 2003. ISBN 80-214-2527-X. In: International Conference NANO'03. Proceedings. - (Šandera, P.), s. 209-212
[NANO'03. Brno (CZ), 21.10.2003-23.10.2003 (K)]
R&D Projects: GA ČR GA202/02/0098
Institutional research plan: CEZ:AV0Z2067918
Keywords : thin films * thermoelectricity * scanning tunnelling microscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0114378 - 6.0304072 - URE-Y 20020116 RIV US eng C - Conference Paper (international conference)
Kinder, R. - Srnánek, R. - Walachová, Jarmila - Hulényi, L. - Tlaczala, M. - Sciana, B. - Radziewicz, D.
Profiling of a GaAs structure using the probe method.
Piscataway: IEEE, 2002. ISBN 0-7803-7276-X. In: ASDAM'02. Proceedings of the Fourth International Conference on Advanced Semiconductor Devices and Microsystems. - (Breza, J.; Donoval, D.), s. 231-234
[Advanced Semiconductor Devices and Microsystems - ASDAM'02 /4./. Smolenice (SK), 14.10.2002-16.10.2002 (K)]
R&D Projects: GA AV ČR KSK1010104 Projekt 04/01:4045
Grant - others:GA Vega(SK) 1/7613/20
Institutional research plan: CEZ:AV0Z2067918
Keywords : impurity distribution * measurement
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0114216 - 7.0303562 - URE-Y 990124 RIV CZ eng C - Conference Paper (international conference)
Vaniš, Jan - Czajka, R. - Horák, Jaromír - Lošťák, P. - Karamazov, S. - Walachová, Jarmila
Modification of Bi2Te3 by STM and AFM.
Pardubice: University of Pardubice, 1999. In: Proceedings of the Fifth European Workshop on Thermoelectrics - ETS'99. - (Lošťák, P.; Koudelka, L.; Drašar, Č.), s. 138-140
[European Workshop on Termoelectrics /5./. Lázně Bohdaneč (CZ), 20.09.1999-21.09.1999]
R&D Projects: GA ČR GA102/97/0427
Grant - others:KBN(PL) 7 T08C 009 11
Institutional research plan: CEZ:AV0Z2067918
Keywords : microscopy * nanostructured materials * semiconductors
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0113777 - 8.0303521 - URE-Y 990109 RIV KR eng C - Conference Paper (international conference)
Czajka, R. - Horák, Jaromír - Lošťák, P. - Karamazov, S. - Vaniš, Jan - Walachová, Jarmila
Characterisation and nanometer-scale modifications of Bi2Te3 surface via the atomic force microscopy.
[Seoul]: [Seoul University], 1999. In: Preliminary Proceedings of STM'99. - (Kuk, Y.; Lyo, I.; Jeon, D.; Park, S.), s. 79-80
[STM'99 Scanning Tunneling Mircoscopy/Spectroscopy and Related Proximal Probe Spectroscopy /10./. Seoul (KR), 19.07.1999-23.07.1999]
R&D Projects: GA ČR GA102/97/0427
Grant - others:KBN(PL) 7 T08C 009 11
Institutional research plan: CEZ:AV0Z2067918
Keywords : microscopes * nanostructured materials * semiconductor materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0113736 - 9.0303462 - URE-Y 990107 RIV SK eng C - Conference Paper (international conference)
Kinder, R. - Walachová, Jarmila - Hulényi, L.
Profiling of HBT structure using the electrochemical CV technique and probe method.
[Liptovský Mikuláš]: [Military Academy], 1999. ISBN 80-8040-098-9. In: Proceedings of the 5th International Workshop Applied Physics of Condensed Matter APCOM'99. - (Macko, P.; Mudroň, J.; Šutta, P.; Vajda, J.), s. 88-92
[APCOM'99 /5./. Kočovce (SK), 23.06.1999-25.06.1999]
R&D Projects: GA ČR GA102/97/0427
Grant - others:GA SR(SK) 1/4219/99
Institutional research plan: CEZ:AV0Z2067918
Keywords : nanostructured materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0113677 - 10.0303038 - URE-Y 970055 CZ cze C - Conference Paper (international conference)
Walachová, Jarmila - Zelinka, Jiří - Vaniš, Jan - Hulicius, Eduard - Šimeček, Tomáš
Měření profilu koncentrace/složení na polovodičových nanovrstvách kontaktní metodou. (Measurement of concentration/composition profiles on semiconductor nanostructures with contract mothod).
Ostrava: VŠB Technická univerzita, 1997. In: Dvanáctá konference Českých a slovenských fyziků. Sborník příspěvků. - (Lesňák, M.; Luňáček, J.; Pištora, J.), s. 479-481
[Konference českých a slovenských fyziků /12./. Ostrava (CZ), 02.09.1996-06.09.1996]
R&D Projects: GA ČR GA202/94/1056
Keywords : doping profiles * semiconductor heterojunctions
Permanent Link: http://hdl.handle.net/11104/0113326