Search results
- 1.0205377 - UPT-D 20010016 RIV US eng J - Journal Article
Frank, Luděk - Zadražil, Martin - Müllerová, Ilona
Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System.
Scanning. Roč. 23, č. 1 (2001), s. 36-50. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA ČR GA202/96/0961; GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscopy * specimen charging * nonconductive specimens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.389, year: 2001
Permanent Link: http://hdl.handle.net/11104/0100991 - 2.0205235 - UPT-D 20000011 RIV AT eng J - Journal Article
Frank, Luděk - Steklý, Richard - Zadražil, Martin - El Gomati, M. M. - Müllerová, Ilona
Electron Backscattering from Real and In-Situ Treated Surfaces.
Microchimica Acta. Roč. 132, 2-4 (2000), s. 179-188. ISSN 0026-3672. E-ISSN 1436-5073
R&D Projects: GA AV ČR IAA1065901; GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.303, year: 2000
Permanent Link: http://hdl.handle.net/11104/0100853 - 3.0205091 - UPT-D 980069 RIV US eng J - Journal Article
Müllerová, Ilona - Zadražil, Martin - Frank, Luděk
Low-energy SEM imaging of bevelled multilayers.
Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 121-122. ISSN 1040-7286.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
R&D Projects: GA ČR GA202/95/0280
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100711 - 4.0205090 - UPT-D 980068 RIV US eng J - Journal Article
Zadražil, Martin - El Gomati, M. M. - Walker, A.
Measurements of very low energy secondary and backscattered electron coefficients.
Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 123-124. ISSN 1040-7286.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100710 - 5.0204999 - UPT-D 980034 RIV CZ cze J - Journal Article
Zadražil, Martin - Frank, Luděk - Müllerová, Ilona
Rastrovací elektronová mikroskopie nevodivých vzorků.
[Scanning Electron Microscopy of Non-Conducting Specimens.]
Bulletin československé společnosti elektronové mikroskopie CSEM. č. 9 (1998), s. 33. ISSN 1212-1258
R&D Projects: GA ČR GA202/96/0961
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100619 - 6.0204820 - UPT-D 960061 RIV AT eng J - Journal Article
Frank, Luděk - Zadražil, Martin - Müllerová, Ilona
Low Energy Imaging of Nonconductive Surfaces in SEM.
Microchimica Acta. Roč. 13, Suppl. (1996), s. 289-298. ISSN 0026-3672. E-ISSN 1436-5073
Impact factor: 0.892, year: 1996
Permanent Link: http://hdl.handle.net/11104/0100440