Search results
- 1.0205650 - UPT-D 20030032 RIV HR eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Wandrol, Petr - Špinka, Jiří
Detection of backscattered electrons in environmental scanning electron microscope.
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 489 - 490
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : collection angle * signal level * detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101263 - 2.0205510 - UPT-D 20020060 RIV CZ eng C - Conference Paper (international conference)
Jirák, Josef - Autrata, Rudolf - Špinka, Jiří
Detection of signal electrons at higher pressure in the specimen chamber.
Proceedings of the 8th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 55 - 56. ISBN 80-238-8986-9.
[Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
R&D Projects: GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscopy * higher pressures * surface negative charge
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101123 - 3.0205509 - UPT-D 20020059 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Špinka, Jiří
X-ray microanalysis in ESEM and LV SEM.
Proceedings of the 8th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 51 - 54. ISBN 80-238-8986-9.
[Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
R&D Projects: GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : primary electron * low vacuum * electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101122 - 4.0205508 - UPT-D 20020058 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Romanovský, Vladimír - Špinka, Jiří
Combined detector for BSE, SE and BSE+SE detection in a low voltage SEM.
Proceedings of the 8th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 49 - 50. ISBN 80-238-8986-9.
[Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
R&D Projects: GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : low accelerating voltage * electrons beam * Everhart-Thornley
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101121 - 5.0205251 - UPT-D 20000027 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Špinka, Jiří
Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures.
Proceedings of the 12th European Congress on Electron Microscopy. Brno: Czechoslovak Society for Electron Microscopy, 2000 - (Frank, L.; Čiampor, F.), s. I245-I246. ISBN 80-238-5503-4.
[EUREM /12./ - European Congress on Electron Microscopy. Brno (CZ), 09.07.2000-14.07.2000]
R&D Projects: GA ČR GA102/00/0969
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100869 - 6.0205191 - UPT-D 990096 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Michálek, Martin - Špinka, Jiří
Study of conditions for observation of electrode masses in a higher-pressure scanning electron microscope.
22nd Meeting on Electrochemical Power Sources. Brno: Czech Electrotechnical Society, 1998, s. 26-28. ISBN 80-214-1359-X.
[Electrochemical Power Sources /22./. Brno (CZ), 29.08.1999-02.09.1999]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100811 - 7.0205190 - UPT-D 990095 RIV HR eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Špinka, Jiří
Scanning electron microscopy at higher pressure.
1st Congress of the Croatian Society for Electron Microscopy. Zagreb: Croatian Society for Electron Microscopy, 1999, s. 75-77.
[Congress of the Croatian Society for Electron Microscopy /1./. Zagreb (HR), 13.05.1999-16.05.1999]
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100810 - 8.0205189 - UPT-D 990094 RIV HR eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Špinka, Jiří
Signal detection in SEM at higher pressure.
1st Congress of the Croatian Society for Electron Microscopy. Zagreb: Croatian Society for Electron Microscopy, 1999, s. 63-64.
[Congress of the Croatian Society for Electron Microscopy /1./. Zagreb (HR), 13.05.1999-16.05.1999]
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100809 - 9.0205149 - UPT-D 990052 RIV HU eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Špinka, Jiří
Detection of SEs and BSEs at Higher Pressure.
Proceedings of the 4th Multinational Congress on Electron Microscopy. Veszprém: University of Veszprém, 1999, s. 285-286.
[MCEM '99 /4./ - Multinational Congress on Electron Microscopy. Veszprém (HU), 05.09.1999-08.09.1999]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100769 - 10.0205147 - UPT-D 990050 RIV HU eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Špinka, Jiří - Romanovský, Vladimír
Environmental scanning electron microscopy for the study of wet specimens.
Proceedings of the 4th Multinational Congress on Electron Microscopy. Veszprém: University of Veszprém, 1999, s. 105-111.
[MCEM '99 /4./ - Multinational Congress on Electron Microscopy. Veszprém (HU), 05.09.1999-08.09.1999]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100767