Search results
- 1.0507132 - ÚPT 2020 RIV CZ eng C - Conference Paper (international conference)
Frank, Luděk - Nebesářová, Jana - Vancová, Marie - Paták, Aleš - Mikmeková, Eliška - Müllerová, Ilona
Transmission of very slow electrons as a diagnostic tool.
NANOCON 2013 - 5th International Conference Proceedings. Ostrava: TANGER Ltd, 2014, s. 503-508. ISBN 978-80-87294-47-5.
[International Conference NANOCON 2013 /5./. Brno (CZ), 16.10.2013-18.10.2013]
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : electron microscopy * slow electrons * STEM * graphene * ultrathin tissue sections
OECD category: Nano-materials (production and properties); Civil engineering (BC-A)
Permanent Link: http://hdl.handle.net/11104/0298349 - 2.0499701 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona
Sixty years of the Institute os Scientific Instruments.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
Institutional support: RVO:68081731
Keywords : electron-microscopy * sem
OECD category: Nano-materials (production and properties)
Permanent Link: http://hdl.handle.net/11104/0291922 - 3.0494373 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Řiháček, Tomáš - Horák, M. - Schachinger, T. - Matějka, Milan - Mika, Filip - Müllerová, Ilona
Creation of electron vortex beams using the holographic reconstruction method in a scanning electron microscope.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 66-67. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron vortex beams * scanning electron microscopy * electron diffraction
OECD category: Nano-materials (production and properties)
Permanent Link: http://hdl.handle.net/11104/0287630 - 4.0494365 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mikmeková, Eliška - Mika, Filip - Müllerová, Ilona
STEM modes in SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 40-41. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : SEM * STEM
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287599 - 5.0494360 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
Very low energy electron transmission spectromicroscopy.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 14-15. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : low energy scanning electron microscopy * electron microscopy * time of flight * electron energy lost spectroscopy
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287590 - 6.0481585 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mika, Filip - Müllerová, Ilona
STEM modes in SEM – simulations and experiments.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 140-141. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : STEM detector * trajectory simulations * cathode lens * collection efficiency
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0277129 - 7.0467260 - ÚPT 2017 JP eng C - Conference Paper (international conference)
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Reflected and transmitted mode in the scanning low energy electron microscope.
2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). Toyama: University of Toyama, 2016, s. 29-30.
[Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2). Toyama (JP), 13.10.2016-14.10.2016]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0265401 - 8.0460211 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Řiháček, Tomáš - Mika, Filip - Matějka, Milan - Krátký, Stanislav - Müllerová, Ilona
Difraction in a scanning electron microscopie.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 56-57. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron microscopy * TEM * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260343 - 9.0460206 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk
Scanning transmission microscopy at very low energies.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 40-41. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : electron microscopy * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260338 - 10.0460205 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Mika, Filip - Konvalina, Ivo - Krátký, Stanislav - Müllerová, Ilona
Bandpass filter for secondary electrons in SEM - experiments.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 36-37. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron microscopy * TLD
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260337