Search results
- 1.0358593 - ÚPT 2012 RIV NL eng J - Journal Article
Radlička, Tomáš - Lencová, Bohumila
Influence of the clusters on the Bi LMIS properties.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 124-129. ISSN 0168-9002. E-ISSN 1872-9576
Grant - others:EC 7FP(XE) NMP4-SE-2008-200613
Source of funding: R - Framework programmes of European Commission
Keywords : liquid–metal ion sources * coulomb interactions * secondary ion mass spectroscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196578 - 2.0358591 - ÚPT 2012 RIV NL eng J - Journal Article
Neděla, Vilém - Konvalina, Ivo - Lencová, Bohumila - Zlámal, J.
Comparison of calculated, simulated and measured signal amplification in variable pressure SEM.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 79-83. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA ČR GAP102/10/1410; GA MPO FR-TI1/118; GA MPO FR-TI1/305
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron-gas interactions * Monte Carlo simulations * signal amplification * analytical models
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196577 - 3.0358590 - ÚPT 2012 RIV NL eng J - Journal Article
Oral, Martin - Lencová, Bohumila
Correction of sample tilt in FIB instruments.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 130-135. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : sample tilt * extraction field * correction of elliptical beam shape * calculation of intensity distribution * focused ion beams
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196576 - 4.0358560 - ÚPT 2012 RIV NL eng J - Journal Article
Zlámal, J. - Lencová, Bohumila
Development of EOD for the design in electron and ion microscopy.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 654, č. 1 (2011), s. 278-282. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : finite element method * tolerancing * user interface
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196559 - 5.0350850 - ÚPT 2011 RIV NL eng J - Journal Article
Radlička, Tomáš - Lencová, Bohumila
Determination of analytical expansion from numerical field data.
Ultramicroscopy. Roč. 110, č. 9 (2010), s. 1198-1204. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron optics * aberrations * differential algebra method * axial field derivatives
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.061, year: 2010
Permanent Link: http://hdl.handle.net/11104/0190740 - 6.0336294 - ÚPT 2010 RIV CZ cze J - Journal Article
Liška, I. - Adamec, P. - Lencová, Bohumila
Coulombovské interakce elektronů v blízkosti Schottkyho katody.
[Coulomb Interactions of electrons in the vicinity of the Schottky source.]
Jemná mechanika a optika. Roč. 54, 11-12 (2009), s. 315-317. ISSN 0447-6441
Institutional research plan: CEZ:AV0Z20650511
Keywords : Coulomb Interactions * Schottky emission source * Monte Carlo simulations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0180555 - 7.0333616 - ÚPT 2010 RIV GB eng J - Journal Article
Jánský, Pavel - Zlámal, J. - Lencová, Bohumila - Zobač, Martin - Vlček, Ivan - Radlička, Tomáš
Numerical simulations of the thermionic electron gun for electron-beam welding and micromachining.
Vacuum. Roč. 84, č. 2 (2009), s. 357-362. ISSN 0042-207X. E-ISSN 1879-2715
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : Numerical simulation * Thermionic emission * Electron gun
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.975, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178558 - 8.0333615 - ÚPT 2010 RIV NL eng J - Journal Article
Oral, Martin - Lencová, Bohumila
Calculation of aberration coefficients by ray tracing.
Ultramicroscopy. Roč. 109, č. 11 (2009), s. 1365-1373. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : Aberrations * Aberration coefficients * Ray tracing * Regression * Fitting
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.067, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178557 - 9.0315558 - ÚPT 2009 RIV NL eng J - Journal Article
Lencová, Bohumila - Zlámal, J.
A new program for the design of electron microscopes.
[Nový program pro návrh elektronových mikroskopů.]
Physics Procedia. Roč. 1, č. 1 (2008), s. 315-324. ISSN 1875-3892.
[International Conference on Charged Particle Optics /7./ CPO-7. Cambridge, 24.07.2006-28.07.2006]
Institutional research plan: CEZ:AV0Z20650511
Keywords : finite element method * electron lenses and deflectors * computer-aided design * user interface
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165725 - 10.0314356 - ÚPT 2009 RIV CZ cze J - Journal Article
Kolařík, Vladimír - Matějka, František - Lencová, Bohumila - Kokrhel, Svatopluk - Horáček, Miroslav - Radlička, Tomáš - Urbánek, Michal - Daněk, Lukáš
Zápis tvarovaným elektronovým svazkem.
[Writing System with Shaped Electron Beam.]
Jemná mechanika a optika. Roč. 53, č. 1 (2008), s. 11-16. ISSN 0447-6441
R&D Projects: GA ČR GA102/05/2325
Institutional research plan: CEZ:AV0Z20650511
Keywords : e-beam writing system * shaped electron beam * electron optics column * electron scattering * writing speed
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0164886