Search results

  1. 1.
    0353047 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
    Zlámal, J. - Lencová, Bohumila
    Accurate and Easy-to-use Electron Optical Design Program for Microscopy.
    Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I1.6:1-2. ISBN 978-85-63273-06-2.
    [International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : EOD * FEM * Windows
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0192397
     
     
  2. 2.
    0350661 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
    Lencová, Bohumila
    Recent developments and improvements of EOD program.
    Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 25-28. ISBN 978-80-254-6842-5.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : EOD * particle optics
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350661_01.pdf
    Permanent Link: http://hdl.handle.net/11104/0190601
     
     
  3. 3.
    0315455 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
    Lencová, Bohumila
    Solving Complex Electron Optical Problems with EOD.
    [Řešení složitých elektronově optických problémů v EOD.]
    Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 65-68. ISBN 978-80-254-0905-3.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : electron optical design * electron mirror * hexapole corrector
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0165654
     
     
  4. 4.
    0315453 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
    Jánský, Pavel - Lencová, Bohumila - Zlámal, J.
    Numerical Simulations of Thermionic Electron Guns.
    [Numerické výpočty termoemisních elektronových trysek.]
    Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 51-52. ISBN 978-80-254-0905-3.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : electron emission * electron gun * space charge * numerical simulations
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0165652
     
     
  5. 5.
    0315085 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
    Jánský, Pavel - Lencová, Bohumila - Zlámal, J.
    Accurate calculations of thermionic electron gun properties.
    [Přesné výpočty vlastností termoemisní elektronové trysky.]
    EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 557-558. ISBN 978-3-540-85154-7.
    [EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : electron emission * electron gun * space charge
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0004856
     
     
  6. 6.
    0315084 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
    Radlička, Tomáš - Lencová, Bohumila
    Influence of tilt of sample on axial beam properties.
    [Vliv náklonění vzorku na vlastnosti osového svazku.]
    EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 599-600. ISBN 978-3-540-85154-7.
    [EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : parasitic aberration * misalignment aberrations
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0004855
     
     
  7. 7.
    0315082 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
    Neděla, Vilém - Jánský, Pavel - Lencová, Bohumila - Zlámal, J.
    Experimental and simulated signal amplification in variable pressure SEM.
    [Experimentální a simulované zesílení signálu v mikroskopu VP-SEM.]
    EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 587-588. ISBN 978-3-540-85154-7.
    [EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
    R&D Projects: GA AV ČR KJB200650602
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : VP-SEM * gas ionisation cascade * EOD * Monte-Carlo
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0004853
     
     
  8. 8.
    0205615 - UPT-D 20020168 RIV CZ eng C - Conference Paper (international conference)
    Lencová, Bohumila - Zlámal, J. - Jánský, P.
    Programs for design of systems in particle optics.
    International summer school: Role of physics in future applications: from nanotechnology to macroelectronics. Tři Studně: VUT, 2002, s. -.
    [Role of physics in future applications: from nanotechnology to macroelectronics. Tři Studně (CZ), 10.06.2002-15.06.2002]
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : particle optics * ion beam implantation * electron optical design
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0101228
     
     
  9. 9.
    0205500 - UPT-D 20020050 RIV CZ eng C - Conference Paper (international conference)
    Lencová, Bohumila
    Is this BEM useful for the computation of magnetic lenses?
    Proceedings of the 8th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 15 - 16. ISBN 80-238-8986-9.
    [Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : boundary element method * magnetic lenses
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0101113
     
     
  10. 10.
    0205499 - UPT-D 20020049 RIV CZ eng C - Conference Paper (international conference)
    Lencová, Bohumila
    Accuracy of potential computations with FOFEM.
    Proceedings of the 8th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 13 - 14. ISBN 80-238-8986-9.
    [Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : electron optical computations
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0101112
     
     

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