Search results
- 1.0352432 - ÚPT 2011 SG eng A - Abstract
Zlámal, J. - Lencová, Bohumila
EOD (Electron Optical Design) program.
Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 210-211.
[CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
Grant - others:EC 7FP(XE) NMP4-SE-2008-2006013
Source of funding: R - Framework programmes of European Commission
Keywords : EPD program * electron microscop
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191939 - 2.0352428 - ÚPT 2011 SG eng A - Abstract
Neděla, Vilém - Konvalina, Ivo - Lencová, Bohumila - Zlámal, J.
Comparison of calculated, simulated and measured signal amplification in variable pressure SEM.
Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 81-82.
[CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : SEM * variable pressure SEM * AQUASEM * EOD * YAG-BSE detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191935 - 3.0352427 - ÚPT 2011 SG eng A - Abstract
Oral, Martin - Lencová, Bohumila
Correction of sample tilt in FIB instruments.
Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 75-76.
[CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : particle optical instruments * elliptical spot * astigmatic focusing * optimization computation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191934 - 4.0352426 - ÚPT 2011 SG eng A - Abstract
Zlámal, J. - Lencová, Bohumila
Development of EOD for the design in electron and ion microscopy.
Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 73-74.
[CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : EOD * electron microscopy * ion microscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191933 - 5.0352425 - ÚPT 2011 SG eng A - Abstract
Radlička, Tomáš - Lencová, Bohumila
Influence of the clusters on the Bi LMIS properties.
Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 44-45.
[CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
Grant - others:EC 7FP(XE) NMP4-SE-2008-200613
Source of funding: R - Framework programmes of European Commission
Keywords : liquid–metal ion sources * discrete coulomb interactions * clusters
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191932 - 6.0205693 - UPT-D 20030076 GB eng A - Abstract
Lencová, Bohumila
Accurate FOFEM computations and ray tracing in particle optics.
Final Programe and Abstract on Electron Microscopy and Analysis Group Conference EMAG 2003. Oxford: University of Oxford, 2003. s. NIM.1.3.
[EMAG 2003. 03.09.2003-05.09.2003, Oxford]
R&D Projects: GA ČR GA202/03/1575
Institutional research plan: CEZ:AV0Z2065902
Keywords : electron optics * low voltage SEM * computation of aberrations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101306 - 7.0205692 - UPT-D 20030075 GB eng A - Abstract
Lencová, Bohumila - Hawkes, P.
The chromatic aberrations of electron lens doublets.
Final Programe and Abstract on Electron Microscopy and Analysis Group Conference EMAG 2003. Oxford: University of Oxford, 2003. s. TMS.1.3.
[EMAG 2003. 03.09.2003-05.09.2003, Oxford]
Grant - others:EC(XE) G5RD-CT-2000-00344
Institutional research plan: CEZ:AV0Z2065902
Keywords : electron optics * chromatic aberration computation * electrostatic lenses
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101305 - 8.0205520 - UPT-D 20020070 US eng A - Abstract
Lencová, Bohumila
On magnetic lens computation with FEM and BEM.
Proceedings of international charged particle optics conference. Greenbelt: University of Maryland, 2002. s. -.
[International charged particle optics conference. 22.10.2002-25.10.2002, Greenbelt]
Grant - others:GA EC(XE) G5RD-CT-2000-00344
Institutional research plan: CEZ:AV0Z2065902
Keywords : magnetic lens computation * FEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101133 - 9.0205519 - UPT-D 20020069 US eng A - Abstract
Lencová, Bohumila - Lenc, M.
The sources of errors in first order FEM for electrostatic lenses.
Proceedings of international charged particle optics conference. Greenbelt: University of Maryland, 2002. s. -.
[International charged particle optics conference. 22.10.2002-25.10.2002, Greenbelt]
Grant - others:GA EC(XE) G5RD-CT-2000-00344
Institutional research plan: CEZ:AV0Z2065902
Keywords : first order FEM * electrostatic lenses * accuracy of computation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101132 - 10.0205518 - UPT-D 20020068 US eng A - Abstract
Lencová, Bohumila
Accuracy estimate for magnetic electron lenses computed by first order FEM.
Proceedings of international charged particle optics conference. Greenbelt: University of Maryland, 2002. s. -.
[International charged particle optics conference. 22.10.2002-25.10.2002, Greenbelt]
Grant - others:GA EC(XE) G5RD-CT-2000-00344
Institutional research plan: CEZ:AV0Z2065902
Keywords : magnetic electron lenses * accuracy of computation * FEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101131