Search results
- 1.0205153 - UPT-D 990056 RIV HU eng C - Conference Paper (international conference)
Klvač, Martin - Jirák, J.
Detector for Backscattered Electrons in Environmental SEM.
Proceedings of the 4th Multinational Congress on Electron Microscopy. Veszprém: University of Veszprém, 1999, s. 335-336.
[MCEM '99 /4./ - Multinational Congress on Electron Microscopy. Veszprém (HU), 05.09.1999-08.09.1999]
R&D Projects: GA ČR GA102/97/0988; GA ČR GA102/98/0796
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100773 - 2.0205035 - UPT-D 980083 RIV NL eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Klvač, Martin - Špinka, Jiří
Detector of backscattered electrons for environmental SEM.
Proceedings of the 11th European Congress on Electron Microscopy. Brussels: Committee of European Societies of Microscopy, 1998, s. 142-143. ISBN 2-9600163-0-0.
[EUREM /11./ - European Congress on Electron Microscopy. Dublin (IE), 26.08.1996-30.08.1996]
R&D Projects: GA ČR GA102/94/0677
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100655 - 3.0204997 - UPT-D 980028 RIV MX eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, J. - Klvač, Martin - Špinka, J.
Detection of BSE signal at higher pressures in the specimen chamber.
Proceedings of the 14th International Congress on Electron Microscopy. Bristol: Institute of Physics Publishing Ltd., 1998 - (Benavides, H.; Yacamán, M.), s. 509-510. ISBN 0-7503-0568-1.
[ICEM /14./ - International Congress on Electron Microscopy. Cancun (MX), 31.08.1998-04.09.1998]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100617 - 4.0204978 - UPT-D 980006 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Romanovský, Vladimír - Jirák, J. - Klvač, Martin
Ionisation Detector for the Environmental SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 6th Seminar. Brno: Czechoslovak Society for Electron Microscopy, 1998 - (Müllerová, I.; Frank, L.), s. 11-12. ISBN 80-238-2333-7.
[Recent Trends /6./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 29.06.1998-03.07.1998]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100598 - 5.0204977 - UPT-D 980005 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, J. - Klvač, Martin - Romanovský, Vladimír
Detection Of Backscattered Electrons in Environmental SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 6th Seminar. Brno: Czechoslovak Society for Electron Microscopy, 1998 - (Müllerová, I.; Frank, L.), s. 9-10. ISBN 80-238-2333-7.
[Recent Trends /6./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 29.06.1998-03.07.1998]
R&D Projects: GA ČR GA102/97/0988
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100597 - 6.0204853 - UPT-D 960095 RIV IE eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Klvač, Martin - Špinka, Jiří
Detector of backscattered electrons for environmental SEM.
CD-ROM Proceedings of the 11th European Congress on Electron Microscopy. Dublin: University College, 1996, s. -.
[EUREM /11./ - European Congress on Electron Microscopy. Dublin, 26.08.1996-30.08.1996)]
Permanent Link: http://hdl.handle.net/11104/0100473 - 7.0204769 - UPT-D 960007 RIV CZ eng C - Conference Paper (international conference)
Klvač, Martin - Romanovský, Vladimír
Integrated Scintillation and Ionization Detector for ESEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 5th Seminar. Brno: Czechoslovak Society for Electron Microscopy, 1996 - (Müllerová, I.; Frank, L.), s. 67-68
[Recent Trends /5./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 24.06.1996-28.06.1996]
Permanent Link: http://hdl.handle.net/11104/0100389