Search results
- 1.0385752 - ÚPT 2013 RIV CZ cze J - Journal Article
Zobač, Martin - Zobačová, Jitka - Vlček, Ivan
Technologické využití elektronového svazku.
[Technological utilization of electron beams.]
Jemná mechanika a optika. Roč. 57, č. 10 (2012), s. 270-274. ISSN 0447-6441
Institutional support: RVO:68081731
Keywords : focused intense electron beam * welding * machining * heat treatment * surface modification * engraving * texturing * additive manufacturing
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215575 - 2.0205670 - UPT-D 20030052 RIV US eng J - Journal Article
Zobačová, Jitka - Frank, Luděk
Specimen Charging and Detection of Signal from Non-conductors in a Cathode Lens-Equipped Scanning Electron Microscope.
Scanning. Roč. 25, č. 3 (2003), s. 150 - 156. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA AV ČR IBS2065017
Institutional research plan: CEZ:AV0Z2065902
Keywords : nonconductive specimens * specimen charging * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.733, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101283 - 3.0205398 - UPT-D 20010038 RIV US eng J - Journal Article
Frank, Luděk - Müllerová, Ilona - Zobačová, Jitka
Imaging of Unstained and Uncoated Specimens in the Scanning Electron Microscope at Optimum Electron Energy.
Scanning. Roč. 23, č. 6 (2001), s. 116. ISSN 0161-0457. E-ISSN 1932-8745
Institutional research plan: CEZ:AV0Z2065902
Keywords : nonconductive specimens * scanning electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.389, year: 2001
Permanent Link: http://hdl.handle.net/11104/0101012 - 4.0043765 - ÚPT 2007 RIV US eng J - Journal Article
Zobačová, Jitka - Zobač, Martin - Oral, Martin - Müllerová, Ilona - Frank, Luděk
Corrections of Magnification and Focusing in a Cathode Lens-Equipped Scanning Electron Microscope.
[Korekce zvětšení a zaostření v rastrovacím elektronovém mikroskopu s katodovou čočkou.]
Scanning. Roč. 28, č. 3 (2006), s. 155-163. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA AV ČR KJB2065301
Institutional research plan: CEZ:AV0Z20650511
Keywords : low-energy scanning electron microscopy (SEM) * cathode lens * critical dimension measurement in SEM * automatic corrections
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.462, year: 2006
Permanent Link: http://hdl.handle.net/11104/0136677