Search results
- 1.0494361 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Dupák, Libor - Zobač, Martin - Vlček, Ivan - Zobačová, Jitka
Electron beam welding at ISI Brno.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 18-20. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron beam welding
OECD category: Mechanical engineering
Permanent Link: http://hdl.handle.net/11104/0287591 - 2.0387386 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Zobač, Martin - Vlček, Ivan - Zobačová, Jitka - Rek, Antonín
Small-Volume Reactive Metal Alloys Prepared by Electron Beam Melting.
METAL 2012 Conference Proceedings. 21st International Conference on Metallurgy and Materials. Ostrava: TANGER Ltd, 2012, -. ISBN 978-80-87294-29-1.
[METAL 2012. International Conference on Metallurgy and Materials /21./. Brno (CZ), 23.05.2012-25.05.2012]
R&D Projects: GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : active solder * tin alloys * titanium alloys * electron beam melting * water cooled crucible
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0216610 - 3.0386447 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Zobačová, Jitka - Hüger, E. - Urbánek, Michal - Polčák, J. - Frank, Luděk
Imaging of SiCN thin films on silicon substrate in the scanning low energy electron microscope.
Physic and Nanoscale. (Proceedings of the 10th IUVSTA International Summer School ). Praha: IOP AS CR, 2012 - (Fejfar, A.; Vetushka, A.). ISBN 978-80-260-0619-0.
[Physics at Nanoscale. IUVSTA International Summer School /10./. Devět skal (CZ), 30.05.2012-04.06.2012]
Institutional support: RVO:68081731
Keywords : SiCN thin films * sillicon substrate * scanning low energy electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215745 - 4.0350672 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Zobačová, Jitka - Mikmeková, Šárka - Polčák, J. - Frank, Luděk
Imaging of thermal treated thin films on silicon substrate in the scanning low energy electron microscope.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 69-70. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : thin films * SLEEM * Si substrate
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350672_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190612 - 5.0205486 - UPT-D 20020036 RIV CZ eng C - Conference Paper (international conference)
Zobačová, Jitka - Zdražil, Josef - Müllerová, Ilona - Frank, Luděk
SEM imaging of nonconductive powders at critical energy.
Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society. Brno: CSMS, 2002 - (Frank, L.), s. 73 - 74. ISBN 80-238-8749-1.
[CSEM. Vranovská Ves (CZ), 08.02.2002-09.02.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : SEM * critical energy * slow secondary electronscathode heating
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101099 - 6.0205405 - UPT-D 20010045 RIV IT eng C - Conference Paper (international conference)
Zobačová, Jitka - Müllerová, Ilona - Frank, Luděk
Imaging of Uncoated Biostructures in a Conventional SEM Adapted to Very Low Energy Microscopy.
Proceedings of 5th Multinational Congress on Electron Microscopy. Lecce: Rinton Press, 2001 - (Dini, L.; Catalano, M.), s. 527-528. ISBN 1-58949-003-7.
[MCEM '01 /5./ - Multinational Congress on Electron Microscopy. Lecce (IT), 20.09.2001-25.09.2001]
R&D Projects: GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Keywords : non-conductive samples * conventional SEM * electron landing energy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101019 - 7.0205302 - UPT-D 20000081 RIV DE eng C - Conference Paper (international conference)
Zobačová, Jitka - Müllerová, Ilona - Frank, Luděk - Srnánek, R. - Kováč, J. - Barna, A.
Examination of nanostructured multilayers by the scanning low energy microscopy.
Proceedings of Autumn School 2000 on Material Science nad Electron Microscopy. Berlin: Fritz Haber Institut, 2000 - (Su, D.; Wrabetz, S.), s. 45-46
[Material Science nad Electron Microscopy - Autumn School 2000. Berlin (DE), 10.10.2000-15.10.2000]
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100917 - 8.0205270 - UPT-D 20000049 RIV CZ eng C - Conference Paper (international conference)
Zobačová, Jitka - Müllerová, Ilona - Hutař, Otakar - Frank, Luděk
Measurement of the critical energy in the SEM equipped with the cathode lens.
Proceedings EMAS 2000 - 4th Regional Workshop on Electron Probe Microanalysis Today - Practical Aspects. Prague: Czech Technical University in Prague, Faculty of Mechanical Engineering, 2000 - (Starý, V.; Horák, K.; Voňková, V.), s. 209. ISBN 80-01-02176-9.
[EMAS 2000 - Regional Workshop on Electron Probe Microanalysis Today /4./. Třešť (CZ), 17.05.2000-20.05.2000]
R&D Projects: GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100888 - 9.0205269 - UPT-D 20000048 RIV CZ eng C - Conference Paper (international conference)
Hutař, Otakar - Müllerová, Ilona - Romanovský, Vladimír - Zobačová, Jitka
Recent trends in low voltage scanning electron microscopy for the imaging of semiconductor devices.
Proceedings EMAS 2000 - 4th Regional Workshop on Electron Probe Microanalysis Today - Practical Aspects. Prague: Czech Technical University in Prague, Faculty of Mechanical Engineering, 2000 - (Starý, V.; Horák, K.; Voňková, V.), s. 205. ISBN 80-01-02176-9.
[EMAS 2000 - Regional Workshop on Electron Probe Microanalysis Today /4./. Třešť (CZ), 17.05.2000-20.05.2000]
R&D Projects: GA AV ČR IAA1065901
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100887 - 10.0205246 - UPT-D 20000022 RIV CZ eng C - Conference Paper (international conference)
Zobačová, Jitka - Frank, Luděk
Signal detection near the critical energy of non-charging illumination in low-energy SEM equipped with a cathode lens.
Proceedings of the 12th European Congress on Electron Microscopy. Brno: Czechoslovak Society for Electron Microscopy, 2000 - (Frank, L.; Čiampor, F.), s. I203-I204. ISBN 80-238-5503-4.
[EUREM /12./ - European Congress on Electron Microscopy. Brno (CZ), 09.07.2000-14.07.2000]
R&D Projects: GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100864