Search results
- 1.0205592 - UPT-D 20020142 RIV CZ cze C - Conference Paper (international conference)
Hrnčiřík, Petr
Rastrovací elektronová mikroskopie pomalými a Augerovými elektrony.
[Scanning electron microscopy by slow and Auger electrons.]
Sborník prací prezentovaných na Semináři doktorandů oboru Elektronová optika konaném dne 16. 12. 2002. Brno: Ústav přístrojové techniky AV ČR, 2002 - (Müllerová, I.), s. 15 - 17. ISBN 80-238-9915-5.
[PDS 2002. Brno (CZ), 16.12.2002]
R&D Projects: GA AV ČR IAA1065901
Institutional research plan: CEZ:AV0Z2065902
Keywords : Auger spectroscopy * microscopy with slow electrons * computer simulations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101205 - 2.0205583 - UPT-D 20020133 RIV CZ eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Müllerová, Ilona
Computer controlled SEM with Schottky cathode for imaging in slow and Auger electrons.
Proceedings of 8th conference EEICT 2002. Brno: FEKT VUT Brno, 2002, s. -.
[EEICT 2002. Brno (CZ), 25.04.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : ultrahighvacuum * scanning electron microscope * surface analysis
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101196 - 3.0205485 - UPT-D 20020035 RIV CZ eng C - Conference Paper (international conference)
Hrnčiřík, Petr
Computer controlled SEM Tesla BS 350 with cathode for detection of slow and Auger electrons.
Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society. Brno: CSMS, 2002 - (Frank, L.), s. 71 - 72. ISBN 80-238-8749-1.
[CSEM. Vranovská Ves (CZ), 08.02.2002-09.02.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : in-situ comparison of the signals * slow electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101098 - 4.0109098 - UPT-D 20040103 RIV SI eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Müllerová, Ilona
Examination Of Nanostructures By Electron Beam.
[Studium nanostruktur elektronovým svazkem.]
EMAS 2004 - 6th Regional Workshop on Electron Probe Analysis Today - Practical Aspects. Bled: European Microbeam Analysis Society, 2004, s. 139.
[EMAS 2004 /6./ Electron Probe Analysis Today - Practical Aspects. Bled (SI), 08.05.2004-11.05.2004]
R&D Projects: GA AV ČR KJB2065405
Keywords : scanning electron microscope * scanning Auger electron microscopy * very slow electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016210 - 5.0109042 - UPT-D 20040043 RIV CZ eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Müllerová, Ilona
Very Low Energy Scanning Electron Microscopy.
[Rastrovací elektronová mikroskopie pomalými elektrony.]
Proceedings of the 9th International Seminar Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, 2004 - (Müllerová, I.), s. 33-34. ISBN 80-239-3246-2.
[Recent Trends /9./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 12.07.2004-16.07.2004]
R&D Projects: GA AV ČR KJB2065405
Keywords : low energy electrons, * inelastic mean free path * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016154 - 6.0109027 - UPT-D 20040028 RIV BE eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Křivánek, O. - Müllerová, Ilona
Very low energy scanning transmission electron microscopy.
[Rastrovací prozařovací elektronová mikroskopie pomalými elektrony.]
EMC 2004 - Proceedings of the 13th European Microscopy Congress. Vol. 1. Liege: Belgian Society for Microscopy, 2004, s. 333-334.
[EMC 2004 /13./ European Microscopy Congress. Antwerp (BE), 22.08.2004-27.08.2004]
R&D Projects: GA AV ČR KJB2065405
Keywords : energy electrons * inelastic mean free path * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016139 - 7.0051198 - ÚPT 2007 RIV JP eng C - Conference Paper (international conference)
Müllerová, Ilona - Hrnčiřík, Petr
Scanning Alternative to the LEEM.
[Rastrující provedení metody LEEM.]
The 5th International Conference on LEEM/PEEM. Himeji: JSRRI, 2006, s. 26.
[LEEM/PEEM /5./. Himeji (JP), 15.10.2006-19.10.2006]
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : LEEM * SLEEM * cathode lens * low energy electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0141121 - 8.0022401 - ÚPT 2006 RIV CH eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Romanovský, Vladimír - Müllerová, Ilona
Aquisition of signals from thin foils bombarded with very low energy electrons.
[Získávání signálů z tenkých folií po dopadu elektronů s velmi nízkou energií.]
Proceedings - Microscopy Conference 2005 - Dreiländertagung /6./. Villigen: Paul Scherrer Institute, 2005, s. 43. ISBN N. ISSN 1019-6447.
[Dreiländertagung Microscopy Conference (MC 2005). Davos (CH), 28.08.2005-02.09.2005]
R&D Projects: GA AV ČR KJB2065405
Keywords : very low energy electrons * scanning electron microscope * transmitted electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0111141