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  1. 1.
    0370027 - ÚFM 2012 RIV IT eng O - Others
    Buršík, Jiří - Svoboda, Milan - Meduňa, M. - Růžička, J. - Caha, O.
    TEM study of oxide precipitates and other microstructural defects in Czochralski-grown silicon after various heat treatments.
    10th Multinational Congress on Microscopy 2011. Urbino: Urbino University "Carlo Bo", 2011. s. 539-540
    Institutional research plan: CEZ:AV0Z20410507
    Keywords : Czochralski silicon * oxide * precipitate
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Permanent Link: http://hdl.handle.net/11104/0203945
     
     


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