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  1. 1.
    0602380 - FZÚ DATA Scientific data      2024
    More Chevalier, Joris - Martan, J. - Repän, T. - Duprey, S. - Hruška, Petr - Novotný, Michal - Honnerová, P. - Kejzlar, Jan - Labbé, C. - Poupon, Morgane - Prokop, Dejan - Nikitin, D. - Portier, X. - Fitl, Přemysl - Cardin, J. - Jaaniso, R. - Lančok, Ján

    Reflective and black Aluminium properties.

    Description: The data are in text form. They concern X-Ray diffraction pattern and optical reflectivity from visible to infra red wavelength, for each sample of reflective and black aluminium. The figures presented in the manuscript are also available in the dataset files.

    BAl 1-PB-better.xy.txt // BAl 2-PB-better.xy.txt // BAl 3-PB-better.xy.txt // diffuse reflectivities of Al films.txt // emissivities of Al films.txt // emissivities of B-Al films.txt // Figure 1.tif // Figure 2.tif // Figure 3.tif // Figure 4.tif // figure 5.png // Figure 6.tif // Figure 7.tif // Figure S1.tif // IR reflectivities of Al films.txt // IR reflectivities of B-Al films.txt // number of morphologies.txt // RAl-1-PB-better.xy.txt // RAl 2-PB-better.xy.txt // RAl 3-PB better.xy.txt
    Keywords : black aluminium * light-trapping structures * aluminium and black aluminium thermal conductivity * aluminium and black aluminium emissivity
    R&D Projects: GA MŠMT(CZ) EH22_008/0004596
    Institutional support: RVO:68378271
    OECD category: Coating and films
    DOI: https://doi.org/10.57680/asep.0602380
    Handle: https://hdl.handle.net/11104/0359556
    Depositor: admin
    Date of release: 5.12.2024
     
    Spectral emissivity and thermal conductivity properties of black aluminum films

     
         License: CC BY 4.0 - Attribution-International license
     
    File DownloadSizeCommentaryAccess
    Data and figures.zip File list13029.6 MBopen-access
    R&D Projects: GA MŠMT(CZ) EH22_008/0004596
    Institutional support: RVO:68378271
    DateTagBefore changeAfter change
    4.6.2025Link to publication in ASEPAdded link https://hdl.handle.net/11104/0364741
  2. 2.
    0602125 - FZÚ DATA Scientific data      2024
    More Chevalier, Joris - Wdowik, U. D. - Cichoň, Stanislav - de Prado, Esther - Legut, D. - Novotný, Michal - Levinský, Petr - Hruška, Petr - Martan, J. - Baba, T. - Pokorný, Jan - Bulíř, Jiří - Fekete, Ladislav - Volfová, Lenka - Lančok, Ján

    ScN data.

    Description: The data are related to the paper “Enhancing thermoelectric properties of ScN films through twin domains” published in Applied Surface Science Advances. They concern the XRD data, the Raman spectroscopy data, Seebeck coefficients, and Electrical resistivities for ScN almost defect free and ScN with twin domains. The calculated data of each property are also provided.

    Keywords : nitride films * thermoelectricity * scandium Nitride * twin domains * seebeck coefficient
    R&D Projects: GA MŠMT(CZ) EH22_008/0004596
    Institutional support: RVO:68378271
    OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
    DOI: https://doi.org/10.57680/asep.0602125
    Handle: https://hdl.handle.net/11104/0359332
    Depositor: admin
    Date of release: 3.12.2024
     
    Enhancing thermoelectric properties of ScN films through twin domains

     
         License: CC BY 4.0 - Attribution-International license
     
    File DownloadSizeCommentaryAccess
    data.zip File list9934.3 MBopen-access
    R&D Projects: GA MŠMT(CZ) EH22_008/0004596
    Institutional support: RVO:68378271
    DateTagBefore changeAfter change
    16.4.2025Link to publication in ASEPAdded link https://hdl.handle.net/11104/0365804
  3. 3.
    0585608 - FZÚ DATA Scientific data      2024
    Correa, Cinthia Antunes - More Chevalier, Joris - Hruška, Petr - Poupon, Morgane - Novotný, Michal - Minárik, P. - Hubík, Pavel - Lukáč, František - Fekete, Ladislav - Prokop, Dejan - Hanuš, J. - Valenta, J. - Fitl, Přemysl - Lančok, Ján

    Dataset for Microstructure and physical properties of black aluminum antireflective films.

    Description: The files are related to the manuscript „Microstructure and physical properties of Black-Aluminum antireflective films“ and are organized in the sequence of appearance in the manuscript. The nomenclature of the files follows the sequence:
    Figure, number of the figure appearing in the manuscript (from 1 – 7), type of data (XRD, AFM, TEM, EDX, PALS, Reflectance, Carrier concentration, Electrical mobility, or resistivity), thin film sample related to (R-Al or B-Al), film thickness (60, 180, 250, 320, or 410 nm).
    TEM image files are raw, as collected, while the ones in the manuscript were cropped to show the differences between the films.

    Keywords : powder x-ray diffraction * atomic force microscopy * transmission electron microscopy * energy dispersive x-ray analysis * positron annihilation spectroscopy * reflectivity, resistivity * hall measurements
    R&D Projects: GA ČR GA23-05002S; GA MŠMT(CZ) EH22_008/0004596; GA MŠMT LM2023051
    Institutional support: RVO:68378271Institutional support: RVO:61389021
    OECD category: Condensed matter physics (including formerly solid state physics, supercond.); Materials engineering (UFP-V)
    DOI: https://doi.org/10.57680/asep.0585608
    Handle: https://hdl.handle.net/11104/0353281
    Depositor: admin
    Date of release: 2.5.2024
     
    Microstructure and physical properties of black-aluminum antireflective films
     

     
         License: CC BY 4.0 - Attribution-International license
     
    File DownloadSizeCommentaryAccess
    Data.zip File list8947.5 MBopen-access
    R&D Projects: GA ČR GA23-05002S; GA MŠMT(CZ) EH22_008/0004596; GA MŠMT LM2023051
    Institutional support: RVO:68378271Institutional support: RVO:61389021
    DateTagBefore changeAfter change
    27.5.2024Data file nameDataset related to the microstructure and physical properties of black aluminum antireflective films.Dataset for Microstructure and physical properties of black aluminum antireflective films.
    14.5.2024RVORVO:61389021
    14.5.2024Data file nameGraphs and figures related to the microstructure and physical properties of black aluminum antireflective films.Dataset related to the microstructure and physical properties of black aluminum antireflective films.
    14.5.2024Data file nameGraphs and figures related to the microstructure properties of black aluminum antireflective films.Graphs and figures related to the microstructure and physical properties of black aluminum antireflective films.
    10.5.2024File accessRequire/embargoOpen Access
    10.5.2024Additional License20240602
  4. 4.
    0585551 - FZÚ DATA Scientific data      2024
    Irimiciuc, Stefan Andrei - Grumezescu, V. - Holban, A. M. - Gherasim, O. - Chertopalov, Sergii - Garoi, P. - Craciun, V. - Lančok, Ján

    Dataset for Silver oxide phase tailoring for improved antimicrobial activity.

    Description: This data sheets contain This dataset contains data from morphological and structural analysis of pulsed laser deposited silver oxide thin films and their antibacterial behavior.

    File 1. Scanning electron microscopy images of AgxO films produced by pulsed laser deposition deposited in O2 at 0.01 Pa (a), 0.1 Pa(b) and 1 Pa (c). The images were recorded using a magnification of 100 000 x.
    File 2. Optical transmission spectra in the 300-800 nm range of the AgxO films containing different oxide phases (a) and the corresponding Tauc plots (b) recalculated using the Tauc plot method
    File 3. X-ray diffraction patterns in the 20 -80 degrees range for the AgxO films deposited in 0.01, 0.1 and 1 Pa or O2 and the Photoelectron spectra recorded form the AgxO multiphase films as follows: in the 364-378 eV for the Ag3d peak and the 525-535 eV for the O1s peak.
    File 4. Antibacterial activity of the AgxO films after 4 (a) and 24 hours (b) which depicts the evolution of Staphylococcus aureus and Escherichia coli bacteria population on the silver oxide films after the samples were intubated at 37 degrees for the two times that they were investigated.

    Keywords : antimicrobial activity * silver oxide phase tailoring * pulsed laser deposition * x ray diffraction pattern
    R&D Projects: GA MŠMT(CZ) EH22_008/0004596
    Institutional support: RVO:68378271
    OECD category: Materials engineering
    DOI: https://doi.org/10.57680/asep.0585551
    Handle: https://hdl.handle.net/11104/0353279
    Depositor: admin
    Date of release: 30.4.2024
    Phase tailoring of silver oxide thin films for improved antimicrobial activity
     

     
         License: CC BY 4.0 - Attribution-International license
     
    R&D Projects: GA MŠMT(CZ) EH22_008/0004596
    Institutional support: RVO:68378271
    DateTagBefore changeAfter change
    27.5.2024Data file nameData files related to „Silver oxide phase tailoring for improved antimicrobial activity“Dataset for Silver oxide phase tailoring for improved antimicrobial activity


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