Search results
- 1.0205660 - UPT-D 20030042 RIV HR eng C - Conference Paper (international conference)
Horáček, Miroslav
Charge-coupled device area detector for low energy electrons.
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 476 - 477
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA ČR GA202/03/1575
Institutional research plan: CEZ:AV0Z2065902
Keywords : position-sensitive detector * angle-selective detection * energy-selective detection
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101273 - 2.0205652 - UPT-D 20030034 RIV HR eng C - Conference Paper (international conference)
Müllerová, Ilona - Frank, Luděk
Current trends in scanning low energy electron microscopy (SLEEM).
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 85 - 86
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA AV ČR IAA1065304
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscopy * primary beam energy * field emission gun
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101265 - 3.0205651 - UPT-D 20030033 RIV HR eng C - Conference Paper (international conference)
Autrata, Rudolf - Neděla, Vilém - Horký, D.
Influence of water environment on biological specimens imaging in ESEM.
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 497 - 498
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA ČR GA102/01/1271; GA AV ČR IBS2065107
Institutional research plan: CEZ:AV0Z2065902
Keywords : hydratation * wet specimen * pumping process
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101264 - 4.0205650 - UPT-D 20030032 RIV HR eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Wandrol, Petr - Špinka, Jiří
Detection of backscattered electrons in environmental scanning electron microscope.
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 489 - 490
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : collection angle * signal level * detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101263 - 5.0205649 - UPT-D 20030031 RIV HR eng C - Conference Paper (international conference)
Autrata, Rudolf - Neděla, Vilém - Horký, D. - Schauer, Petr
Comparison of imaging with SE ionization and BSE scintillation detector in ESEM.
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 487 - 488
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : ionisation detector * scintillation detector * environmental microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101262 - 6.0205648 - UPT-D 20030030 RIV HR eng C - Conference Paper (international conference)
Autrata, Rudolf - Matějková, Jiřina
Backscattered electron imaging using the improved YAG scintillation detector.
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 450 - 451
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA AV ČR IBS2065107
Institutional research plan: CEZ:AV0Z2065902
Keywords : backscattered electron * scintillator * detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101261 - 7.0205647 - UPT-D 20030029 RIV HR eng C - Conference Paper (international conference)
Schauer, Petr - Nešpůrek, Stanislav - Schauer, F. - Autrata, Rudolf
Electron beam degradation study of silicon polymers.
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 205 - 206
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA ČR GA202/01/0518
Institutional research plan: CEZ:AV0Z4050913; CEZ:AV0Z2065902
Keywords : cathodoluminescence * degradation * polymer
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101260