Search results
- 1.0205552 - UPT-D 20020102 RIV ZA eng C - Conference Paper (international conference)
Frank, Luděk - Müllerová, Ilona - El-Gomati, M.
SEM visualization of doping in semiconductors.
Proceedings of 15th international congress on electron microscopy. Durban: Microscopy society of Southern Africa, 2002 - (Engelbrecht, J.; Sewell, T.; Witcomb, M.; Cross, R.; Richards, P.), s. 39 - 40. ISBN 0-620-29294-6.
[ICEM. Durban (ZA), 01.09.2002-06.09.2002]
R&D Projects: GA AV ČR IAA1065901
Institutional research plan: CEZ:AV0Z2065902
Keywords : dopant concentration * image contrast * secondary electron
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101165 - 2.0205547 - UPT-D 20020097 RIV GB eng C - Conference Paper (international conference)
El-Gomati, M. - Romanovský, V. - Frank, Luděk - Müllerová, Ilona
A very low energy electron column for surface studies.
[Osvětlovací systém s velmi pomalými elektrony pro studium povrchů.]
Proceedings of the Institute of Physics electron microscopy and analysis group conference. Bristol: Institute of Physics Publishing, 2001 - (Aindow, M.; Kiely, C.), s. 111 - 114. ISBN 0-7503-0812-5.
[EMAG. Dundee (GB), 05.09.2001-07.09.2001]
Institutional research plan: CEZ:AV0Z2065902
Keywords : electrostatic * low energy * surface analysis
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101160 - 3.0205545 - UPT-D 20020095 RIV JP eng C - Conference Paper (international conference)
Frank, Luděk - Müllerová, Ilona - El-Gomati, M. - Jayakody, H.
SEM acquired electronic contrast of doped areas in semiconductors and its interpretation.
Proceedings of seminar on nanotechnology for fabrication of hybrid materials. Toyama: JPJSMA, 2002, s. 9 - 12.
[Japanese-polish joint seminar on materials analysis. Toyama (JP), 06.11.2002-08.11.2002]
R&D Projects: GA AV ČR IAA1065901
Institutional research plan: CEZ:AV0Z2065902
Keywords : secondary electrons * electronic contrast * semiconductors
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101158 - 4.0205504 - UPT-D 20020054 RIV CZ eng C - Conference Paper (international conference)
Romanovský, V. - El-Gomati, M. - Frank, Luděk - Müllerová, Ilona
Fully electrostatic low energy scanning electron column.
Proceedings of the 8th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 33 - 34. ISBN 80-238-8986-9.
[Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : electron optical computations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101117 - 5.0205503 - UPT-D 20020053 RIV CZ eng C - Conference Paper (international conference)
Frank, Luděk - Müllerová, Ilona - El-Gomati, M.
Secondary electron contrast of dopped regions in semiconductor - a matter of surface treatment?
Proceedings of the 8th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 25 - 26. ISBN 80-238-8986-9.
[Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
R&D Projects: GA AV ČR IAA1065901
Institutional research plan: CEZ:AV0Z2065902
Keywords : semiconductor technology * lower energies * multilayers
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101116 - 6.0205496 - UPT-D 20020046 RIV ZA eng C - Conference Paper (international conference)
El-Gomati, M. - Romanovský, V. - Frank, Luděk - Müllerová, Ilona
A very low energy scanning electron column for surface studies.
Proceedings of 15th international congress on electron microscopy. Durban: Microscopy society of Southern Africa, 2002 - (Engelbrecht, J.; Sewell, T.; Witcomb, M.; Cross, R.; Richards, P.), s. 323 - 324. ISBN 0-620-29294-6.
[ICEM. Durban (ZA), 01.09.2002-06.09.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : low voltage microscopy * electron signals
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101109 - 7.0205490 - UPT-D 20020040 RIV CZ eng C - Conference Paper (international conference)
Romanovský, Vladimír - El-Gomati, M.
Electrostatic mini SLEEM for surface studies.
Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society. Brno: CSMS, 2002 - (Frank, L.), s. 95 - 96. ISBN 80-238-8749-1.
[CSEM. Vranovská Ves (CZ), 08.02.2002-09.02.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : low-energy electrons * charging effect * non-conductive specimens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101103