Search results
- 1.0205085 - UPT-D 980021 RIV GB eng C - Conference Paper (international conference)
El Gomati, M. M. - Assa'd, A. M. D. - El Gomati, T. - Zadražil, Martin
On the measurement of low energy backscattered and secondary electron coefficients.
Electron Microscopy and Analysis 1997 - Proceedings of the Institute of Physics Conference (Series Number 153, Section 7). Bristol: Institute of Physics Publishing Ltd., 1997 - (Rodenburg, J.), s. 265-268. ISBN 0-7503-0441-3.
[EMAG '97 - Electron Microscopy and Analysis Conference. Cambridge (GB), 02.09.1997-05.09.1997]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100705 - 2.0205084 - UPT-D 980020 RIV GB eng C - Conference Paper (international conference)
Cubric, D. - Lencová, Bohumila - Read, F. H.
Comparison of Finite Difference, Finite Element and Boundary Element Methods for Electrostatic Charged Particle Optics.
Electron Microscopy and Analysis 1997 - Proceedings of the Institute of Physics Conference (Series Number 153, Section 3). Bristol: Institute of Physics Publishing Ltd., 1997 - (Rodenburg, J.), s. 91-94. ISBN 0-7503-0441-3.
[EMAG '97 - Electron Microscopy and Analysis Conference. Cambridge (GB), 02.09.1997-05.09.1997]
Grant - others:RS(GB) 630003.P607
Subject RIV: JC - Computer Hardware ; Software
Permanent Link: http://hdl.handle.net/11104/0100704 - 3.0205083 - UPT-D 980019 RIV GB eng C - Conference Paper (international conference)
Srnanek, R. - Satka, A. - Liday, J. - Vogrincic, P. - Kovac, J. - Zadražil, Martin - Frank, Luděk - El Gomati, M. M.
Study of bevelled InP-based heterostructures by low energy SEM and AES.
Electron Microscopy and Analysis 1997 - Proceedings of the Institute of Physics Conference (Series Number 153, Section 10). Bristol: Institute of Physics Publishing Ltd., 1997 - (Rodenburg, J.), s. 453-456. ISBN 0-7503-0441-3.
[EMAG '97 - Electron Microscopy and Analysis Conference. Cambridge (GB), 02.09.1997-05.09.1997]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100703