Search results
- 1.0205126 - UPT-D 990029 RIV GB eng C - Conference Paper (international conference)
El Gomati, M. M. - Müllerová, Ilona - Frank, Luděk
Combination of Scanning Auger and Very-Low-Energy Electron Microscopy.
Proceedings of the International Centennial Symposium on the Electron. Cambridge: The University Press, 1998 - (Kirkland, A.; Brown, P.), s. 326-333. ISBN 1-86125-051-7.
[Electron - Centennial Symposium. Cambridge (GB), 15.09.1997-17.09.1997]
R&D Projects: GA ČR GA202/95/0280
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100746 - 2.0205089 - UPT-D 980065 RIV DE eng C - Conference Paper (international conference)
Srnánek, R. - Škriniarová, J. - Kováč, J. - Frank, Luděk - Novotný, I. - Hotový, I. - Gottschalch, V.
Recognition of defects in semiconductor heterostructures on bevelled surface.
Defect Recognition and Image Processing in Semiconductors 1997 - Proceedings of the Institute of Physics Conference (Series Number 160). Bristol: Institute of Physics Publishing Ltd., 1997 - (Donecker, J.; Rechenberg, I.), s. 409-412. ISBN 0-7503-0500-2.
[DRIP /7./. Berlin (DE), 07.09.1997-10.09.1997]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100709 - 3.0205085 - UPT-D 980021 RIV GB eng C - Conference Paper (international conference)
El Gomati, M. M. - Assa'd, A. M. D. - El Gomati, T. - Zadražil, Martin
On the measurement of low energy backscattered and secondary electron coefficients.
Electron Microscopy and Analysis 1997 - Proceedings of the Institute of Physics Conference (Series Number 153, Section 7). Bristol: Institute of Physics Publishing Ltd., 1997 - (Rodenburg, J.), s. 265-268. ISBN 0-7503-0441-3.
[EMAG '97 - Electron Microscopy and Analysis Conference. Cambridge (GB), 02.09.1997-05.09.1997]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100705 - 4.0205083 - UPT-D 980019 RIV GB eng C - Conference Paper (international conference)
Srnanek, R. - Satka, A. - Liday, J. - Vogrincic, P. - Kovac, J. - Zadražil, Martin - Frank, Luděk - El Gomati, M. M.
Study of bevelled InP-based heterostructures by low energy SEM and AES.
Electron Microscopy and Analysis 1997 - Proceedings of the Institute of Physics Conference (Series Number 153, Section 10). Bristol: Institute of Physics Publishing Ltd., 1997 - (Rodenburg, J.), s. 453-456. ISBN 0-7503-0441-3.
[EMAG '97 - Electron Microscopy and Analysis Conference. Cambridge (GB), 02.09.1997-05.09.1997]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100703 - 5.0204995 - UPT-D 980026 RIV MX eng C - Conference Paper (international conference)
Zadražil, Martin - El Gomati, M. M.
Measurements of the secondary and backscattered electron coefficients in the energy range 250-5000eV.
Proceedings of the 14th International Congress on Electron Microscopy. Bristol: Institute of Physics Publishing Ltd., 1998 - (Benavides, H.; Yacamán, M.), s. 495-496. ISBN 0-7503-0568-1.
[ICEM /14./ - International Congress on Electron Microscopy. Cancun (MX), 31.08.1998-04.09.1998]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100615 - 6.0204992 - UPT-D 980023 RIV MX eng C - Conference Paper (international conference)
Müllerová, Ilona - Frank, Luděk - El Gomati, M. M.
A compact combined Auger and very low energy electron scanning microscopy.
Proceedings of the 14th International Congress on Electron Microscopy. Bristol: Institute of Physics Publishing Ltd., 1998 - (Benavides, H.; Yacamán, M.), s. 375-376. ISBN 0-7503-0568-1.
[ICEM /14./ - International Congress on Electron Microscopy. Cancun (MX), 31.08.1998-04.09.1998]
R&D Projects: GA ČR GA202/96/0961
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100612 - 7.0204989 - UPT-D 980017 RIV CZ eng C - Conference Paper (international conference)
Zadražil, Martin - Frank, Luděk - Norris, John
Imaging of Non-Conducting Specimens by Noncharging Scanning Electron Microscopy with Method for Automatically Adjusted Critical Energies.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 6th Seminar. Brno: Czechoslovak Society for Electron Microscopy, 1998 - (Müllerová, I.; Frank, L.), s. 83-84. ISBN 80-238-2333-7.
[Recent Trends /6./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 29.06.1998-03.07.1998]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100609 - 8.0204988 - UPT-D 980016 RIV CZ eng C - Conference Paper (international conference)
Zadražil, Martin - El Gomati, M. M.
Measurements of the Secondary and Backscattered Electron Coefficients in the Very Low Energy Range.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 6th Seminar. Brno: Czechoslovak Society for Electron Microscopy, 1998 - (Müllerová, I.; Frank, L.), s. 82. ISBN 80-238-2333-7.
[Recent Trends /6./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 29.06.1998-03.07.1998]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100608