Search results
- 1.0314212 - ÚPT 2009 RIV NL eng J - Journal Article
Lencová, Bohumila - Lenc, M. - Hawkes, P. W.
A pitfall in the calculation of higher order aberrations.
[Skryté nebezpečí při výpočtu aberací vyšších řádů.]
Ultramicroscopy. Roč. 108, č. 8 (2008), s. 737-740. ISSN 0304-3991. E-ISSN 1879-2723
Institutional research plan: CEZ:AV0Z20650511
Keywords : aberration coefficients
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.629, year: 2008
Permanent Link: http://hdl.handle.net/11104/0164793 - 2.0205460 - UPT-D 20020010 RIV DE eng J - Journal Article
Hawkes, P. W. - Lencová, Bohumila
Studies on the asymptotic cardinal elements and aberration coefficients of symmetric unipotential electrostatic lenses.
Optik. Roč. 113, č. 2 (2002), s. 78 - 82. ISSN 0030-4026. E-ISSN 1618-1336
Institutional research plan: CEZ:AV0Z2065902
Keywords : electrostate lenses * spherical aberration coefficient * thin-lens approximation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.581, year: 2002
Permanent Link: http://hdl.handle.net/11104/0101073 - 3.0204732 - UPT-D 950035 RIV GB eng J - Journal Article
Hawkes, P. W. - Lencová, Bohumila - Lenc, Michal
Approximate expressions for electron lens properties.
Journal of Microscopy. Roč. 179, č. 2 (1995), s. 145-157. ISSN 0022-2720. E-ISSN 1365-2818
Permanent Link: http://hdl.handle.net/11104/0100352 - 4.0080902 - ÚPT 2007 RIV ES eng J - Journal Article
Hawkes, P. W. - Lencová, Bohumila
Charged Particle Optics Theory.
[Teorie optiky nabitých částic.]
E-Nano Newsletter. -, č. 6 (2006), s. 6-8
Grant - others:EC 5RP(XE) G5RD-CT-2000-00344
Institutional research plan: CEZ:AV0Z20650511
Keywords : optics of charged particles * design of ion lithography system * spot profile * the finite element method
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
www.phantomsnet.net
Permanent Link: http://hdl.handle.net/11104/0144931