Search results
- 1.0583656 - ÚPT 2024 RIV CZ cze C - Conference Paper (international conference)
Benešová, Markéta - Bernatová, Silvie - Samek, Ota - Pokorná, Zuzana - Mika, Filip - Kizovský, Martin - Pilát, Zdeněk
SERS-TAGS: Selektivní imobilizace a detekce bakterií pomocí specifických protilátek a povrchově zesíleného Ramanova rozptylu.
[SERS-TAGS: Selective immobilization and detection of bacteria using specific antibodies and surface-enhanced Raman scattering.]
LA63. Sborník příspěvků multioborové konference LASER63. Brno: Ústav přístrojové techniky AV ČR, 2023 - (Mikel, B.), s. 9-12. ISBN 978-80-87441-32-9.
[LASER63. Třešť (CZ), 18.10.2023-20.10.2023]
Institutional support: RVO:68081731
Keywords : Raman spectroscopy * SERS * diagnostcs * SERS-labels
OECD category: Analytical chemistry
Permanent Link: https://hdl.handle.net/11104/0351680 - 2.0494367 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Mika, Filip - Pokorná, Zuzana - Konvalina, Ivo - Khursheed, A.
Possibilites of a secondary electrons bandpass filter for standard SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 46-47. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : secondary electron * filtering * imaging
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0288493 - 3.0467260 - ÚPT 2017 JP eng C - Conference Paper (international conference)
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Reflected and transmitted mode in the scanning low energy electron microscope.
2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). Toyama: University of Toyama, 2016, s. 29-30.
[Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2). Toyama (JP), 13.10.2016-14.10.2016]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0265401 - 4.0460213 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Šiler, Martin - Brzobohatý, Oto - Chvátal, Lukáš - Karásek, Vítězslav - Paták, Aleš - Pokorná, Zuzana - Mika, Filip - Zemánek, Pavel
Golden nanoparticle in optical tweezers: influence of shape and orientation on optical trapping.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 64-65. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA ČR GB14-36681G
Institutional support: RVO:68081731
Keywords : NPs * plasmon resonance
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260345 - 5.0460209 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Knápek, Alexandr
Scanning very low energy electron microscopy for the characterization of polycrystalline metal samples.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 48-49. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
Institutional support: RVO:68081731
Keywords : electron microscopy * SEM * crystallographic orientation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260341 - 6.0460201 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Knápek, Alexandr - Pokorná, Zuzana
Field emission from the surface of highly ordered pyrolytic graphite.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 22-23. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : electron microscopy * HOPG * SNOM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260333 - 7.0450822 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk - Knápek, Alexandr - Konvalina, Ivo - Mikmeková, Eliška - Mikmeková, Šárka - Walker, Christopher - Müllerová, Ilona
Scanning low-and very low energy electron microscopy.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 218-220. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : very low energy * scanning low energy electron microscopy * crystallography, graphene * tissue sections
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0252034 - 8.0434115 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Knápek, Alexandr - Jašek, O. - Prášek, J. - Majzlíková, P.
Imaging of carbon nanostructures by low energy STEM below 5 keV.
18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7.
[International Microscopy Congres /18./. Praha (CZ), 07.09.2014-12.09.2014]
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : low energy STEM * carbon nanostructures
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0238252 - 9.0423862 - ÚPT 2014 DE eng C - Conference Paper (international conference)
Pokorná, Zuzana - Knápek, Alexandr
Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains.
Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 329-330.
[Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
Institutional support: RVO:68081731
Keywords : SLEEM * Crystallographic orientation * polycrystalline metal * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0229924 - 10.0423860 - ÚPT 2014 DE eng C - Conference Paper (international conference)
Knápek, Alexandr - Pokorná, Zuzana
Algorithm for Analysis of a Data Cube of Electron Micrographs.
Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 325-326.
[Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
R&D Projects: GA TA ČR TE01020118; GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : SLEEM * crystallographic orientation * grain boundary recognition
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0229921