Search results

  1. 1.
    0583656 - ÚPT 2024 RIV CZ cze C - Conference Paper (international conference)
    Benešová, Markéta - Bernatová, Silvie - Samek, Ota - Pokorná, Zuzana - Mika, Filip - Kizovský, Martin - Pilát, Zdeněk
    SERS-TAGS: Selektivní imobilizace a detekce bakterií pomocí specifických protilátek a povrchově zesíleného Ramanova rozptylu.
    [SERS-TAGS: Selective immobilization and detection of bacteria using specific antibodies and surface-enhanced Raman scattering.]
    LA63. Sborník příspěvků multioborové konference LASER63. Brno: Ústav přístrojové techniky AV ČR, 2023 - (Mikel, B.), s. 9-12. ISBN 978-80-87441-32-9.
    [LASER63. Třešť (CZ), 18.10.2023-20.10.2023]
    Institutional support: RVO:68081731
    Keywords : Raman spectroscopy * SERS * diagnostcs * SERS-labels
    OECD category: Analytical chemistry
    Permanent Link: https://hdl.handle.net/11104/0351680
     
     
  2. 2.
    0494367 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Mika, Filip - Pokorná, Zuzana - Konvalina, Ivo - Khursheed, A.
    Possibilites of a secondary electrons bandpass filter for standard SEM.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 46-47. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : secondary electron * filtering * imaging
    OECD category: Coating and films
    Permanent Link: http://hdl.handle.net/11104/0288493
     
     
  3. 3.
    0467260 - ÚPT 2017 JP eng C - Conference Paper (international conference)
    Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
    Reflected and transmitted mode in the scanning low energy electron microscope.
    2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). Toyama: University of Toyama, 2016, s. 29-30.
    [Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2). Toyama (JP), 13.10.2016-14.10.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0265401
     
     
  4. 4.
    0460213 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Šiler, Martin - Brzobohatý, Oto - Chvátal, Lukáš - Karásek, Vítězslav - Paták, Aleš - Pokorná, Zuzana - Mika, Filip - Zemánek, Pavel
    Golden nanoparticle in optical tweezers: influence of shape and orientation on optical trapping.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 64-65. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    R&D Projects: GA ČR GB14-36681G
    Institutional support: RVO:68081731
    Keywords : NPs * plasmon resonance
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260345
     
     
  5. 5.
    0460209 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Pokorná, Zuzana - Knápek, Alexandr
    Scanning very low energy electron microscopy for the characterization of polycrystalline metal samples.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 48-49. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    Institutional support: RVO:68081731
    Keywords : electron microscopy * SEM * crystallographic orientation
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260341
     
     
  6. 6.
    0460201 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Knápek, Alexandr - Pokorná, Zuzana
    Field emission from the surface of highly ordered pyrolytic graphite.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 22-23. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : electron microscopy * HOPG * SNOM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260333
     
     
  7. 7.
    0450822 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
    Pokorná, Zuzana - Frank, Luděk - Knápek, Alexandr - Konvalina, Ivo - Mikmeková, Eliška - Mikmeková, Šárka - Walker, Christopher - Müllerová, Ilona
    Scanning low-and very low energy electron microscopy.
    12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 218-220. ISBN 978-963-05-9653-4.
    [MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : very low energy * scanning low energy electron microscopy * crystallography, graphene * tissue sections
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0252034
     
     
  8. 8.
    0434115 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
    Pokorná, Zuzana - Knápek, Alexandr - Jašek, O. - Prášek, J. - Majzlíková, P.
    Imaging of carbon nanostructures by low energy STEM below 5 keV.
    18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7.
    [International Microscopy Congres /18./. Praha (CZ), 07.09.2014-12.09.2014]
    R&D Projects: GA MŠMT(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : low energy STEM * carbon nanostructures
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0238252
     
     
  9. 9.
    0423862 - ÚPT 2014 DE eng C - Conference Paper (international conference)
    Pokorná, Zuzana - Knápek, Alexandr
    Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains.
    Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 329-330.
    [Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
    Institutional support: RVO:68081731
    Keywords : SLEEM * Crystallographic orientation * polycrystalline metal * cathode lens
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0229924
     
     
  10. 10.
    0423860 - ÚPT 2014 DE eng C - Conference Paper (international conference)
    Knápek, Alexandr - Pokorná, Zuzana
    Algorithm for Analysis of a Data Cube of Electron Micrographs.
    Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 325-326.
    [Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
    R&D Projects: GA TA ČR TE01020118; GA ČR GAP108/11/2270
    Institutional support: RVO:68081731
    Keywords : SLEEM * crystallographic orientation * grain boundary recognition
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0229921
     
     

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