Search results
- 1.0022416 - ÚPT 2006 MX eng A - Abstract
Lazar, Josef - Růžička, Bohdan - Číp, Ondřej - Balling, P. - Křen, P.
Etalon of optical frequency at the telecommunication band.
[Etalon optické frekvence v telekomunikačním pásmu.]
8th International Symposium on Laser Metrology (LM 2005). León: CIO, 2005. s. 36.
[International Symposium on Laser Metrology /8./. 14.02.2005-18.02.2005, Merida]
R&D Projects: GA AV ČR(CZ) IBS2508201
Keywords : laser diode * frequency stabilization * absorption spectroscopy * FM spectroscopy
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0111156 - 2.0022415 - ÚPT 2006 MX eng A - Abstract
Buchta, Zdeněk - Rychnovský, Jan - Lazar, Josef
Laser system for production of hyperpolarized Xenon.
[Laserový systém pro produkci hyperpolarizovaného xenonu.]
8th International Symposium on Laser Metrology (LM 2005). León: CIO, 2005. s. 122.
[International Symposium on Laser Metrology /8./. 14.02.2005-18.02.2005, Merida]
R&D Projects: GA ČR(CZ) GA102/04/2109
Keywords : optical pumping * Ti:Sa laser * spectroscopy * laser frequency stabilization
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0111155 - 3.0022414 - ÚPT 2006 MX eng A - Abstract
Číp, Ondřej - Mikel, Břetislav - Lazar, Josef
Laser interferometer for absolute distance measurement based on a tunable VCSEL laser.
[Laserový interferometr pro absolutní měření vzdáleností založený na laditelném laseru VCSEL.]
8th International Symposium on Laser Metrology (LM 2005). León: CIO, 2005. s. 194.
[International Symposium on Laser Metrology /8./. 14.02.2005-18.02.2005, Merida]
R&D Projects: GA ČR(CZ) GP102/02/P122
Keywords : wavelength-scanning interferometry * tunable laser
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0111154 - 4.0022413 - ÚPT 2006 MX eng A - Abstract
Číp, Ondřej - Petrů, František - Lazar, Josef
The optical frequency method of distance measurement with sub-nanometer resolution.
[Metoda využívající optickou frekvenci pro měření vzdáleností se subnanometrovým rozlišením.]
8th International Symposium on Laser Metrology (LM 2005). León: CIO, 2005. s. 199.
[International Symposium on Laser Metrology /8./. 14.02.2005-18.02.2005, Merida]
R&D Projects: GA ČR(CZ) GP102/02/P122
Keywords : high-resolution laser interferometry * scale linearity
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0111153