Search results
- 1.0353265 - ÚPT 2011 JP eng A - Abstract
Mikmeková, Šárka - Matsuda, K. - Kawabata, T. - Mizutani, M. - Watanabe, K. - Müllerová, Ilona - Frank, Luděk
Benefits of the Scanning Low Energy Electron Microscopy to Examination of Advanced Materials.
2010 Fall Annual Meeting of The Japan Institute of Metals. Hokkaido: Hokkaido University, 2010. s. 248.
[2010 Fall Annual Meeting of The Japan Institute of Metals. 25.09.2010-29.09.2010, Hokkaido]
Institutional research plan: CEZ:AV0Z20650511
Keywords : SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192557 - 2.0352943 - ÚPT 2011 JP eng A - Abstract
Mikmeková, Šárka - Matsuda, K. - Watanabe, K. - Müllerová, Ilona - Frank, Luděk
SLEEM study of FIB induced damage.
8th Japanese-Polish Joint Seminar on Micro and Nano Analysis. Kyoto: Kyoto University, 2010. s. 7-03.
[Japanese-Polish Joint Seminar on Micro and Nano Analysis /8./. 05.09.2010-08.09.2010, Kyoto]
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscope * focused ion beam technique * SRIM2008
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192319