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- 1.0204972 - UPT-D 970031 US eng A - Abstract
Tarasenko, A. A. - Jastrabík, L. - Chvostova, D. - Sobota, Jaroslav
An ellipsometric study of Ni, Mo and NiNx films deposited on Si.
Final Program & Abstracts of the 2nd International Conference on Spectroscopic Ellipsometry. Charleston: University of North Carolina, 1997. s. P2.14.
[ICSE /2./ - Spectroscopic Ellipsometry. 12.05.1997-15.05.1997]
Permanent Link: http://hdl.handle.net/11104/0100592