Search results
- 1.0105933 - URE-Y 20040120 CZ eng A - Abstract
Vacková, S. - Majlingová, O. - Gorodynskyy, Vladyslav - Gurevich, Yu. G. - Logvinov, G. N. - Žďánský, Karel - Oswald, Jiří - Karel, František
The role of recombination processes in Seebeck effect-application of Gurevich theory on Cd 1-xZnxTe.
20th General Conference Condensed Matter Division EPS. Book of Abstracts. Praha: UK MFF, 2004. s. 117.
[CMD - Condensed Matter Division EPS /20./. 19.07.2004-23.07.2004, Prague]
R&D Projects: GA AV ČR IBS2067354; GA AV ČR KSK1010104
Keywords : Seebeck effect * electrical conductivity * detectors
Subject RIV: JB - Sensors, Measurment, Regulation
Permanent Link: http://hdl.handle.net/11104/0013121 - 2.0105912 - URE-Y 20040119 AU eng A - Abstract
Vacková, S. - Majlingová, O. - Gorodynskyy, Vladyslav - Gurevich, Yu. G. - Logvinov, G. N. - Žďánský, Karel - Oswald, Jiří
The role of recombination processes in seebeck effect - application of Gurevich theory on Cd1-xZn xTe.
23rd International Conference on Thermoelectrics - ICT 2004. Adelaide: University of South Australia, 2004 - (Goel, Ö.). s. 133
[ICT 2004 /23./. 25.07.2004-29.07.2004, Adelaide]
R&D Projects: GA AV ČR(CZ) IBS2067354; GA AV ČR(CZ) KSK1010104
Keywords : photoconductivity * carrier lifetime * Seebeck effect
Subject RIV: JB - Sensors, Measurment, Regulation
www.unisa.edu.au/itee/news/Conferences/CofGol/New_Folder/ICT2004-Book%
Permanent Link: http://hdl.handle.net/11104/0013100 - 3.0042687 - ÚFE 2007 CZ eng A - Abstract
Vacková, S. - Žďánský, Karel - Gorodynskyy, Vladyslav - Majlingová, O. - Oswald, Jiří - Gorley, P. N. - Vacek, R.
Testing of semiconductor materials suitable for radiation detectors by non-traditional methods.
[Testování polovodičových materiálů vhodných pro radiační detektory netradičními metodami.]
CHISA 2006. Summaries 5: Systems and Technology. Praha: Process Engineering Publisher, 2006. s. 1852--. ISBN 80-86059-45-6.
[International Congress of Chemical and Process Engineering CHISA 2006/17th./. 27.08.2006-31.08.2006, Praha]
R&D Projects: GA AV ČR(CZ) KAN400670651
Institutional research plan: CEZ:AV0Z20670512
Keywords : materials testing * deep levels * electron-hole recombination
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0135861