Search results

  1. 1.
    0304012 - URE-Y 20020103 HU eng A - Abstract
    Vaniš, Jan - Chow, D. H. - Pangrác, Jiří - Šroubek, Filip - McGill, T. C. - Walachová, Jarmila
    Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope BEEM with InAs as based electrode.
    Budapest: Rese, 2002. Book of Abstracts EXMATEC'2002. s. 176
    [EXMATEC 2002 - International Workshop on Expert Evaluation & Control of Compounds Semiconductor Materials & Technologies /6./. 26.05.2002-29.05.2002, Budapest]
    R&D Projects: GA AV ČR KSK1010104 Projekt 04/01:4045
    Institutional research plan: CEZ:AV0Z2067918
    Keywords : field emission electron microscopy * semiconductor qunatum wells * spectroscopy
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Permanent Link: http://hdl.handle.net/11104/0114156
     
     
  2. 2.
    0303328 - URE-Y 980117 CZ eng A - Abstract
    Walachová, Jarmila - Zelinka, Jiří - Vaniš, Jan - Chow, D. H. - Karamazov, Simeon - Cukr, Miroslav - Zich, P. - McGill, T. C.
    Testing of quantum well structures by BEEM/BEES.
    Prague: IREE AS CR, 1998. ISBN 80-86269-019. AMFO'98. - (Procházková, O.). s. 14
    [Czech-Chinese Workshop on Advanced Materials for Optoelectronics - AMFO'98. 15.06.1998-17.06.1998, Prague]
    R&D Projects: GA ČR GA102/97/0427
    Keywords : nanostructured materials * spectroscopy * semiconductor quantum wells
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0113574
     
     
  3. 3.
    0105892 - URE-Y 20040171 FR eng A - Abstract
    Vaniš, Jan - Chow, D. H. - Šroubek, Filip - McGill, T. C. M. - Walachová, Jarmila
    Characterization of InAs/AlSb tunneling double barrier heterostructure by reverse ballistic electron emission spectroscoipy with InAs as base electrode.
    7th International Workshop on Expert Evaluation & Control of Compound Semiconductor Materials & Technologies - EXMATEC'2004. [Montpellier]: [GES], 2004. s. 164.
    [EXMATEC 2004 - International Workshop on Expert Evaluation & Control of Compounds Semiconductor Materials & Technologies /7./. 01.06.2004-04.06.2004, Montpellier]
    R&D Projects: GA AV ČR(CZ) KSK1010104
    Keywords : scanning tunelling microscopy * ballistic transport * semiconductor heterojunctions
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Permanent Link: http://hdl.handle.net/11104/0013080
     
     


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