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- 1.0132893 - FZU-D 20000148 CZ eng A - Abstract
Chval, Jindřich - Stejskal, J. - Beran, P. - Strejc, Aleš - Šíma, Vladimír
The characterization of BiSrCaCuO thin layers prepared by MOCVD.
EMAS 2000 - Regional Workshop on Electron Probe Microanalysis Today. Practical aspects. Praha: Sprinter, 2000 - (Starý, V.; Mašek, K.; Horák, K.). s. 197. ISBN 80-01-02176-9.
[EMAS Regional Workshop on Electron Probe Microanalysis Today - EMAS 2000 /4./. 17.05.2000-20.05.2000, Třešť]
Institutional research plan: CEZ:AV0Z1010914
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0030888