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Records found: 40  
Your query: Author Sysno/Doc.kind = "^cav_un_auth 0016276 zj^"
    1.
    0375695 - FZÚ 2012 RIV GB eng J - Journal Article
    Gergely, G. - Gurban, S. - Menyhard, M. - Jablonski, A. - Zemek, Josef - Goto, K.
    Experimental determination of the electron elastic backscattering probability and the surface excitation parameter for Si, Ni, Cu, and Ag at 0.5 and 1 KeV.
    Surface and Interface Analysis. Roč. 43, č. 11 (2011), s. 1365-1370. ISSN 0142-2421. E-ISSN 1096-9918
    R&D Projects: GA ČR GA202/09/0428
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : backscattering probability * SEP * EPES * AREPES * AES * XPS
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.180, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0208283
     
     
    2.
    0349393 - FZÚ 2011 RIV JP eng J - Journal Article
    Jablonski, A. - Zemek, Josef
    Remarks on some reference materials for applications in elastic peak electron spectroscopy.
    Analytical Sciences. Roč. 26, č. 2 (2010), s. 239-246. ISSN 0910-6340. E-ISSN 1348-2246
    R&D Projects: GA ČR GA202/09/0428
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : reference materials * EPES * IMFP
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.465, year: 2010
    http://www.jstage.jst.go.jp/article/analsci/26/2/239/_pdf
    Permanent Link: http://hdl.handle.net/11104/0189646
     
     
    3.
    0328517 - FZÚ 2010 RIV GB eng J - Journal Article
    Zemek, Josef - Houdková, Jana - Jiříček, Petr - Jablonski, A. - Jurka, Vlastimil - Kub, Jiří
    Determination of electron inelastic mean free paths for poly[methyl(phenyl)silylene] films.
    [Stanovení středních neelastických volných drah elektronů v tenkých vrstvách polymetylfenyl silylenu.]
    Polymer. Roč. 50, č. 11 (2009), s. 2445-2450. ISSN 0032-3861. E-ISSN 1873-2291
    R&D Projects: GA ČR GA202/09/0428; GA AV ČR IAA100100622
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : polymer physics * poly[methyl(phenyl)silylene] * inelastic mean free path
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 3.573, year: 2009
    Permanent Link: http://hdl.handle.net/11104/0005425
     
     
    4.
    0322013 - FZÚ 2009 RIV GB eng J - Journal Article
    Jablonski, A. - Zemek, Josef
    Overlayer thickness determination by XPS using the multiline approach.
    [Určování tlouštěk tenkých vrstev z fotoemisních linií.]
    Surface and Interface Analysis. Roč. 41, č. 3 (2008), s. 193-204. ISSN 0142-2421. E-ISSN 1096-9918
    R&D Projects: GA ČR GA202/06/0459
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : computer simulations * electron-solid interactions * Monte Carlo simulations * x-ray photoelectron spectroscopy
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.272, year: 2008
    Permanent Link: http://hdl.handle.net/11104/0170390
     
     
    5.
    0319399 - FZÚ 2009 RIV RO eng J - Journal Article
    Zemek, Josef - Houdková, Jana - Lesiak, B. - Jablonski, A. - Potměšil, Jiří - Vaněček, Milan
    Electron spectroscopy of nanocrystalline diamond surfaces.
    [Elektronová spektroskopie povrchů nanokrystalického diamantu.]
    Journal of Optoelectronics and Advanced Materials. Roč. 8, č. 6 (2006), 2133-2138. ISSN 1454-4164. E-ISSN 1841-7132
    R&D Projects: GA ČR(CZ) GA202/05/2233; GA ČR GA202/06/0459
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : nanocrystalline diamond * x-ray photoelectron spectroscopy * surface properties
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.106, year: 2006
    Permanent Link: http://hdl.handle.net/11104/0005009
     
     
    6.
    0134665 - FZU-D 20030567 RIV NL eng J - Journal Article
    Zemek, Josef - Jiříček, Petr - Jablonski, A. - Lesiak, B.
    Growth mode of ultrathin gold films deposited on nickel.
    Applied Surface Science. Roč. 199, - (2002), s. 138-146. ISSN 0169-4332. E-ISSN 1873-5584
    R&D Projects: GA ČR GA202/02/0237; GA MŠMT ME 548
    Institutional research plan: CEZ:AV0Z1010914
    Keywords : Monte Carlo calculations * X-ray photoelectron spectroscopy * layer-by-layer growth * 3D island-like growth * Au-Ni system
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.295, year: 2002
    Permanent Link: http://hdl.handle.net/11104/0000695
     
     
    7.
    0134659 - FZU-D 20030560 RIV US eng J - Journal Article
    Jiříček, Petr - Zemek, Josef - Lejček, Pavel - Lesiak, B. - Jablonski, A. - Čerňanský, Marian
    Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon.
    Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films. Roč. 20, č. 2 (2002), s. 447-455. ISSN 0734-2101. E-ISSN 1520-8559
    R&D Projects: GA ČR GA202/02/0237
    Institutional research plan: CEZ:AV0Z1010914
    Keywords : Monte Carlo simulation * electron-solid interaction * inelastic mean free path(IMFP) * elastic peak electron spectroscopy(EPES)
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.301, year: 2002
    Permanent Link: http://hdl.handle.net/11104/0032553
     
     
    8.
    0134646 - FZU-D 20030546 RIV US eng J - Journal Article
    Hucek, Stanislav - Zemek, Josef - Jablonski, A. - Tilinin, L. S.
    Emission depth distribution function of Al 2s photoelectrons in Al2O3.
    Surface Review and Letters. Roč. 7, 1&2 (2000), s. 109-114. ISSN 0218-625X. E-ISSN 1793-6667
    R&D Projects: GA ČR GA202/95/0032
    Grant - others:GA UK(CZ) 33
    Institutional research plan: CEZ:AV0Z6022909; CEZ:AV0Z1010914
    Keywords : depth distribution function * DDF * Monte Carlo simulation * Beer-Lambert law * Boltzmann kinetic equation * straight line approximation * SLA
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 0.886, year: 2000
    Permanent Link: http://hdl.handle.net/11104/0032541
     
     
    9.
    0134643 - FZU-D 20030543 RIV GB eng J - Journal Article
    Zemek, Josef - Jiříček, Petr - Hucek, Stanislav - Lesiak, B. - Jablonski, A.
    Measurements of escape probability of photoelectrons and the inelastic mean free path in silver sulphide.
    Surface and Interface Analysis. Roč. 30, - (2000), s. 222-227. ISSN 0142-2421. E-ISSN 1096-9918
    Grant - others:GAUK(CZ) 1051-10/733
    Institutional research plan: CEZ:AV0Z1010914
    Keywords : escape probability * IMFP * Ag2S
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.215, year: 2000
    Permanent Link: http://hdl.handle.net/11104/0032538
     
     
    10.
    0134641 - FZU-D 20030541 RIV NL eng J - Journal Article
    Zemek, Josef - Jiříček, Petr - Lesiak, B. - Jablonski, A.
    Surface excitation in elastic peak electron spectroscopy.
    Surface Science. Roč. 531, - (2003), s. L335-L339. ISSN 0039-6028. E-ISSN 1879-2758
    R&D Projects: GA ČR GA202/02/0237; GA MŠMT ME 548
    Institutional research plan: CEZ:AV0Z1010914
    Keywords : electron-solid interactions * electron-solid scattering and transmission-inelastic * Monte Carlo simulationsurface electron phenomena
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 2.063, year: 2003
    Permanent Link: http://hdl.handle.net/11104/0032536
     
     

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