Search results

  1. 1.
    0507146 - ÚPT 2020 RIV CH eng C - Conference Paper (international conference)
    Hida, S. - Mikmeková, Šárka - Matsuda, K. - Ikeno, S.
    Observation of large Equilibrium Phase of Al-Mg-Si Alloys.
    Materials Science Forum. Vol. 794-796. Durnten-Zurich: Trans Tech Publications, 2014, s. 977-980. ISBN 978-3-03835-120-7. ISSN 0255-5476.
    [International Conference on Aluminium Alloys (ICAA) /14./. Trondheim (NO), 15.06.2014-19.06.2014]
    Institutional support: RVO:68081731
    Keywords : Al-Mg-Si alloy * equilibrium phase TEM
    OECD category: Materials engineering
    Permanent Link: http://hdl.handle.net/11104/0298356
     
     
  2. 2.
    0434111 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
    Ligas, A. - Hida, S. - Matsuda, K. - Mikmeková, Šárka
    Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques.
    18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7.
    [International Microscopy Congres /18./. Praha (CZ), 07.09.2014-12.09.2014]
    R&D Projects: GA TA ČR TE01020118
    Institutional support: RVO:68081731
    Keywords : SLEEM * STLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0238246
     
     
  3. 3.
    0379918 - ÚPT 2013 RIV AU eng C - Conference Paper (international conference)
    Pokorná, Zuzana - Mikmeková, Šárka - Matsuda, K. - Müllerová, Ilona - Frank, Luděk
    Backscattered electrons in examination of materials.
    Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 940:1-2. ISBN 978-1-74052-245-8.
    [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
    R&D Projects: GA ČR GAP108/11/2270
    Institutional support: RVO:68081731
    Keywords : scanning electron microscope * backscattered electrons * cathode lens
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0210769
     
     
  4. 4.
    0379915 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
    Müllerová, Ilona - Mikmeková, Šárka - Matsuda, K. - Mikmeková, Eliška - Ikeno, S. - Shiojiri, M.
    SLEEM and its Applications in Material Research.
    Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 409: 1-2. ISBN 978-1-74052-245-8.
    [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
    R&D Projects: GA MPO FR-TI3/323; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : scanning low energy electron microscopy * cathode lens
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0210766
     
     
  5. 5.
    0352510 - ÚPT 2011 RIV JP eng C - Conference Paper (international conference)
    Mikmeková, Šárka - Matsuda, K. - Watanabe, K. - Mizutani, M. - Narukawa, Y. - Müllerová, Ilona - Frank, Luděk
    Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science.
    Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 77-78. ISBN 978-4-9903248-2-7.
    [JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama (JP), 12.09.2010-15.09.2010]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning low energy electron microscopy * AZ 91 * AZ 96 * UFG Al * matal matrix composite materials
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0192002
     
     
  6. 6.
    0350663 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
    Matsuda, K. - Mizutani, M. - Nishimura, K. - Kawabata, T. - Hishinuma, Y. - Aoyama, S. - Müllerová, Ilona - Frank, Luděk - Ikeno, S.
    Superconductive property and microstructure of MgB2/Al composite materials.
    Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 33-34. ISBN 978-80-254-6842-5.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning low energy electron microscopy * SLEEM * microstructure contrast * composite materials
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350663_01.pdf
    Permanent Link: http://hdl.handle.net/11104/0190603
     
     
  7. 7.
    0335297 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
    Müllerová, Ilona - Matsuda, K. - Horiba, K. - Mikmeková, Šárka - Frank, Luděk
    Orientation of Grains in the Al-Mg-Si-Mn Alloy by Scanning Low Energy Electron Microscopy.
    Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009 - (Pokorná, Z.; Mika, F.), s. 21. ISBN 978-80-254-4535-8.
    [CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./. Brno (CZ), 10.08.2009-14.08.2009]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : EBSD * SEM * grains orientation * Al-Mg-Si-Mn alloy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0179803
     
     
  8. 8.
    0335295 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
    Mizutani, M. - Matsuda, K. - Ikeno, S. - Nashimura, K. - Müllerová, Ilona - Frank, Luděk
    Effect of the Matrix on Superconductive Characteristic of the MgB2 Composite Material.
    Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009 - (Pokorná, Z.; Mika, F.), s. 20. ISBN 978-80-254-4535-8.
    [CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./. Brno (CZ), 10.08.2009-14.08.2009]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : MgB2/AL composite * SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0179801
     
     
  9. 9.
    0315458 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
    Müllerová, Ilona - Matsuda, K. - Frank, Luděk
    Low Energy Electron Microscopy in Materials Science.
    [Nízko energiová elektronová mikroskopie v materiálových vědách.]
    Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 85-86. ISBN 978-80-254-0905-3.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
    R&D Projects: GA MŠMT OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : collection efficiency * cathode lens mode * material contrast
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0165656
     
     
  10. 10.
    0109122 - UPT-D 20040127 RIV JP eng C - Conference Paper (international conference)
    Matsuda, K. - Kajikawa, M. - Frank, Luděk - Müllerová, Ilona - Kawabata, T. - Uetani, Y. - Ikeno, S.
    Observation of alpha-phase in Cu-Zn alloy by SLEEM.
    [Pozorování alfa-fáze ve slitině Cu-Zn pomocí SLEEM.]
    Proceedings of the 44th Annual meeting of Japan Copper and Brass Association. Kisarazu: Japan Copper and Brass Association, 2004, s. 11 - 12.
    [Annual Meeting of Japan Copper and Brass Association /44./. Kisarazu (JP), 12.11.2004-13.11.2004]
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : Cu-Zn alloy * SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0016234
     
     

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