Search results
- 1.0552271 - ÚPT 2022 CZ eng A - Abstract
Jozefovič, Patrik - Watanabe, S. - Matsuda, K. - Müllerová, Ilona - Mikmeková, Šárka
Characterization of Al‑based composites reinforced with CeNF by advanced SEM techniques.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 70.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Institutional support: RVO:68081731
Keywords : Al‑based composites * energy and angular filtering * advanced SEM
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Permanent Link: http://hdl.handle.net/11104/0327404 - 2.0552268 - ÚPT 2022 CZ eng A - Abstract
Mikmeková, Šárka - Konvalina, Ivo - Müllerová, Ilona - Matsuda, K. - Ikeno, S.
Prospect of advanced microscopy in material research.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 88.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Institutional support: RVO:68081731
Keywords : SEM * SLEEM * advanced steels * light metals
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Permanent Link: http://hdl.handle.net/11104/0327400 - 3.0521251 - ÚPT 2020 DE eng A - Abstract
Vaškovicová, Naděžda - Nakamura, N. - Matsuda, K. - Mikmeková, Šárka - Müllerová, Ilona
Cathodoluminescence analysis of AlO2Sr4/Al.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 194-195.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
Institutional support: RVO:68081731
Keywords : strontium * nanophospors * BSE
OECD category: Nano-processes (applications on nano-scale)
https://www.microscopy-conference.de
Permanent Link: http://hdl.handle.net/11104/0305879 - 4.0501096 - ÚPT 2019 GB eng A - Abstract
Müllerová, Ilona - Mikmeková, Šárka - Materna Mikmeková, Eliška - Frank, Luděk - Matsuda, K.
Prospects of Scanning Low Energy Electron Microscopy in Material Science.
Microscopy. Roč. 67, S2 (2018), i18. ISSN 2050-5698. E-ISSN 2050-5701.
[Symposium of The Japanese Society of Microscopy /61./. 11.03.2018-11.03.2018, Toyama]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : low energy electrons * precipitates
OECD category: Nano-materials (production and properties)
Permanent Link: http://hdl.handle.net/11104/0293104 - 5.0452633 - ÚPT 2016 TH eng A - Abstract
Müllerová, Ilona - Frank, Luděk - Konvalina, Ivo - Matsuda, K. - Mikmeková, Eliška - Pokorná, Zuzana - Walker, Christopher
Low Energy Electron Microscopy in Materials Science.
10th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT). Abstracts and Proceedings. Chiang Mai: Chiang Mai University, 2015. s. 20.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /10./. 17.11.2015-21.11.2015, Chiang Mai]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : low energy electrons * contrast in scanning electron microscope * transmission mode in SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0253577 - 6.0353265 - ÚPT 2011 JP eng A - Abstract
Mikmeková, Šárka - Matsuda, K. - Kawabata, T. - Mizutani, M. - Watanabe, K. - Müllerová, Ilona - Frank, Luděk
Benefits of the Scanning Low Energy Electron Microscopy to Examination of Advanced Materials.
2010 Fall Annual Meeting of The Japan Institute of Metals. Hokkaido: Hokkaido University, 2010. s. 248.
[2010 Fall Annual Meeting of The Japan Institute of Metals. 25.09.2010-29.09.2010, Hokkaido]
Institutional research plan: CEZ:AV0Z20650511
Keywords : SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192557 - 7.0352943 - ÚPT 2011 JP eng A - Abstract
Mikmeková, Šárka - Matsuda, K. - Watanabe, K. - Müllerová, Ilona - Frank, Luděk
SLEEM study of FIB induced damage.
8th Japanese-Polish Joint Seminar on Micro and Nano Analysis. Kyoto: Kyoto University, 2010. s. 7-03.
[Japanese-Polish Joint Seminar on Micro and Nano Analysis /8./. 05.09.2010-08.09.2010, Kyoto]
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscope * focused ion beam technique * SRIM2008
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192319 - 8.0109127 - UPT-D 20040132 JP eng A - Abstract
Matsuda, K. - Ishida, Y. - Müllerová, Ilona - Frank, Luděk - Ikeno, S.
Cube phase in excess-Mg Al-Mg-Si alloy studied by EFTEM.
Abstract Booklet - International Symposium on Characterization of Real Materials and Real Processing by Transmission Electron Microscopy. Nagoya: Nagoya University, 2005. s. 27.
[International Symposium on Characterization of Real Materials and Real Processing by Transmission Electron Microscopy. 26.01.2005, Nagoya]
Institutional research plan: CEZ:AV0Z2065902
Keywords : energy filtering TEM * Al-Mg-Si alloy * cube-phase
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016239 - 9.0022553 - ÚPT 2006 JP eng A - Abstract
Matsuda, K. - Ishida, Y. - Müllerová, Ilona - Frank, Luděk - Ikeno, S.
Cube phase in excess-Mg Al-Mg-Si alloy studied by EFTEM.
[Kubická fáze studovaná pomocí EFTEM ve slitině Al-Mg-Si s přídavkem Mg.]
Abstract booklet - International Symposium on Characterization of Real Materials and Real Processing by Transmission Electron Microscopy. Nagoya: Nagoya University, 2005.
[International Symposium on Characterization of Real Materials and Real Processing by Transmission Electron Microscopy. 26.01.2005-27.01.2005, Nagoya]
Institutional research plan: CEZ:AV0Z20650511
Keywords : Al-Mg-Si alloys * cube-shaped phase
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0111281