Search results
- 1.0303287 - URE-Y 980152 RIV SK eng J - Journal Article
Malina, Václav - Moro, L. - Pécz, B.
Technological aspects of non-alloyed Ti/Au contacts to InP.
Journal of Electrical Engineering - Elektrotechnický časopis. Roč. 49, 7-8 (1998), s. 194-199. ISSN 1335-3632. E-ISSN 1339-309X
R&D Projects: GA AV ČR KSK1010601 Projekt 7/96/K:4072; GA ČR GA102/94/1059
Keywords : III-V semiconductors * ohmic contacts * semiconductors * interface phenomena
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0113533 - 2.0303032 - URE-Y 970038 RIV GB eng J - Journal Article
Malina, Václav - Vogel, K. - Ressel, P. - Barnard, W. O. - Knauer, A.
Comparison of Ti/Pt/Au and Ti/Ru/Au contact systems to p-type InGaP.
Semiconductor Science and Technology. Roč. 12, č. 10 (1997), s. 1298-1303. ISSN 0268-1242. E-ISSN 1361-6641
R&D Projects: GA ČR GA102/94/1059
Keywords : III-V semiconductors * ohmic contacts * semiconductors * interface phenomena
Impact factor: 1.141, year: 1997
Permanent Link: http://hdl.handle.net/11104/0113320 - 3.0302992 - URE-Y 970008 NL eng J - Journal Article
Zavadil, Jiří - Starosta, Karel - Hála, J. (ed.) - Reineker, P. (ed.) - Meltzer, R.S. (ed.)
Guided modes in spontaneous edge electroluminescence from GaInAsP/InP heterostructure diodes.
Journal of Luminescence. 72-74, - (1997), s. 1007-1009. ISSN 0022-2313. E-ISSN 1872-7883.
[1996 International Conference on Luminescence and Optical Spectroscopy of Condensed Matter -ICL'96. Prague, 18.08.1996-23.08.1996]
R&D Projects: GA ČR GA102/94/1059
Keywords : waveguide theory
Impact factor: 0.942, year: 1997
Permanent Link: http://hdl.handle.net/11104/0113281 - 4.0302962 - URE-Y 960095 RIV GB eng J - Journal Article
Malina, Václav - Moro, L. - Micheli, V. - Mojzes, I.
Au-Be/Ru/Au multilayer metallization as a stable ohmic contact scheme to p-type InP.
Semiconductor Science and Technology. Roč. 11, č. 7 (1996), s. 1121-1126. ISSN 0268-1242. E-ISSN 1361-6641
R&D Projects: GA ČR GA102/94/1059
Keywords : indium compounds * ohmic contacts * semiconductor-metal boundaries
Impact factor: 1.318, year: 1996
Permanent Link: http://hdl.handle.net/11104/0113251