Search results
- 1.0109098 - UPT-D 20040103 RIV SI eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Müllerová, Ilona
Examination Of Nanostructures By Electron Beam.
[Studium nanostruktur elektronovým svazkem.]
EMAS 2004 - 6th Regional Workshop on Electron Probe Analysis Today - Practical Aspects. Bled: European Microbeam Analysis Society, 2004, s. 139.
[EMAS 2004 /6./ Electron Probe Analysis Today - Practical Aspects. Bled (SI), 08.05.2004-11.05.2004]
R&D Projects: GA AV ČR KJB2065405
Keywords : scanning electron microscope * scanning Auger electron microscopy * very slow electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016210 - 2.0109042 - UPT-D 20040043 RIV CZ eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Müllerová, Ilona
Very Low Energy Scanning Electron Microscopy.
[Rastrovací elektronová mikroskopie pomalými elektrony.]
Proceedings of the 9th International Seminar Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, 2004 - (Müllerová, I.), s. 33-34. ISBN 80-239-3246-2.
[Recent Trends /9./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 12.07.2004-16.07.2004]
R&D Projects: GA AV ČR KJB2065405
Keywords : low energy electrons, * inelastic mean free path * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016154 - 3.0109027 - UPT-D 20040028 RIV BE eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Křivánek, O. - Müllerová, Ilona
Very low energy scanning transmission electron microscopy.
[Rastrovací prozařovací elektronová mikroskopie pomalými elektrony.]
EMC 2004 - Proceedings of the 13th European Microscopy Congress. Vol. 1. Liege: Belgian Society for Microscopy, 2004, s. 333-334.
[EMC 2004 /13./ European Microscopy Congress. Antwerp (BE), 22.08.2004-27.08.2004]
R&D Projects: GA AV ČR KJB2065405
Keywords : energy electrons * inelastic mean free path * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016139 - 4.0022401 - ÚPT 2006 RIV CH eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Romanovský, Vladimír - Müllerová, Ilona
Aquisition of signals from thin foils bombarded with very low energy electrons.
[Získávání signálů z tenkých folií po dopadu elektronů s velmi nízkou energií.]
Proceedings - Microscopy Conference 2005 - Dreiländertagung /6./. Villigen: Paul Scherrer Institute, 2005, s. 43. ISBN N. ISSN 1019-6447.
[Dreiländertagung Microscopy Conference (MC 2005). Davos (CH), 28.08.2005-02.09.2005]
R&D Projects: GA AV ČR KJB2065405
Keywords : very low energy electrons * scanning electron microscope * transmitted electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0111141