Search results
- 1.0551125 - ÚPT 2023 RIV CH eng J - Journal Article
Konvalina, Ivo - Paták, Aleš - Zouhar, Martin - Müllerová, Ilona - Fořt, Tomáš - Unčovský, M. - Materna Mikmeková, Eliška
Quantification of stem images in high resolution sem for segmented and pixelated detectors.
Nanomaterials. Roč. 12, č. 1 (2022), č. článku 71. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
OECD category: Electrical and electronic engineering
Impact factor: 5.3, year: 2022
Method of publishing: Open access
https://www.mdpi.com/2079-4991/12/1/71
Permanent Link: http://hdl.handle.net/11104/0326569 - 2.0498772 - ÚPT 2019 RIV NL eng J - Journal Article
Dapor, M. - Masters, R. - Ross, I. - Lidzey, D. - Pearson, A. - Abril, I. - Garcia-Molina, R. - Sharp, J. - Unčovský, M. - Vystavěl, T. - Mika, Filip - Rodenburg, C.
Secondary electron spectra of semi-crystalline polymers A novel polymer characterisation tool?
Journal of Electron Spectroscopy and Related Phenomena. Roč. 222, JAN (2018), s. 95-105. ISSN 0368-2048. E-ISSN 1873-2526
Institutional support: RVO:68081731
Keywords : energy * microscope * films * semiconductors * spectroscopy
OECD category: Coating and films
Impact factor: 1.343, year: 2018
Permanent Link: http://hdl.handle.net/11104/0291039 - 3.0491708 - ÚPT 2019 RIV NL eng J - Journal Article
Radlička, Tomáš - Unčovský, M. - Oral, Martin
In lens BSE detector with energy filtering.
Ultramicroscopy. Roč. 189, JUN (2018), s. 102-108. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron optics * scanning electron microscopy * back scattered electrons * energy filtering
OECD category: Electrical and electronic engineering
Impact factor: 2.644, year: 2018
Permanent Link: http://hdl.handle.net/11104/0285349 - 4.0395127 - ÚPT 2014 RIV GB eng J - Journal Article
Mikmeková, Eliška - Bouyanfif, H. - Lejeune, M. - Müllerová, Ilona - Hovorka, Miloš - Unčovský, M. - Frank, Luděk
Very low energy electron microscopy of graphene flakes.
Journal of Microscopy. Roč. 251, č. 2 (2013), s. 123-127. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : graphene * very low energy STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.150, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225233 - 5.0367292 - ÚPT 2012 RIV US eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Konvalina, Ivo - Unčovský, M. - Frank, Luděk
Scanning transmission low-energy electron microscopy.
IBM Journal of Research and Development. Roč. 55, č. 4 (2011), 2:1-6. ISSN 0018-8646. E-ISSN 2151-8556
R&D Projects: GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : TEM * STEM * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.723, year: 2011
Permanent Link: http://hdl.handle.net/11104/0202028