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- 1.0557881 - ÚPT 2023 RIV CA eng C - Conference Paper (international conference)
Venglovskyi, Iurii
Magnetic Resonance Spectroscopy Signal Analysis Based on Fingerprinting Dictionary Approaches.
Proceedings of the 7th World Congress on Electrical Engineering and Computer Systems and Science (EECSS’21). Orléans: International ASET, 2021, č. článku ICBES114. ISBN 978-1-927877-92-0.
[International Conference on Biomedical Engineering and Systems (ICBES’21) /8./. online (CZ), 29.07.2021-31.07.2021]
R&D Projects: GA MŠMT(CZ) EF16_013/0001775
EU Projects: European Commission(XE) 813120 - INSPiRE-MED
Institutional support: RVO:68081731
Keywords : magnetic resonance spectroscopy * fingerprinting dictionary * spectroscopic imaging * artificial intelligence
OECD category: Medical engineering
https://avestia.com/EECSS2021_Proceedings/files/paper/ICBES/ICBES_114.pdf
Permanent Link: http://hdl.handle.net/11104/0331780File Download Size Commentary Version Access ICBES_114.pdf 9 622.5 KB Publisher’s postprint open-access - 2.0557880 CA BXXS
Proceedings of the 7th World Congress on Electrical Engineering and Computer Systems and Science (EECSS’21).
Orléans: International ASET, 2021. ISBN 978-1-927877-92-0 - 3.0507775 CA BXXS
Proceedings of the 5th World Congress on New Technologies (NewTech'19).
Ontario: International ASET Inc., 2019. ISBN 978-1-927877-62-3. ISSN 2369-8128 - 4.0507761 - ÚTIA 2020 RIV CA eng C - Conference Paper (international conference)
Aussel, D. - Branda, Martin - Henrion, R. - Pištěk, Miroslav
Producer's Best Response in Pay-as-clear Electricity Market with Uncertain Demand.
Proceedings of the 5th World Congress on New Technologies (NewTech'19). Ontario: International ASET Inc., 2019, č. článku 105. ISBN 978-1-927877-62-3. ISSN 2369-8128.
[World Congress on New Technologies (NewTech'19) /5./. Lisabon (PT), 18.08.2019-20.08.2019]
R&D Projects: GA ČR GA17-08182S; GA ČR(CZ) GA18-04145S
Institutional support: RVO:67985556
Keywords : Nash equilibria * uncertainty * Independent System Operator (ISO)
OECD category: Pure mathematics
http://library.utia.cas.cz/separaty/2019/MTR/pistek-0507761.pdf
Permanent Link: http://hdl.handle.net/11104/0298746 - 5.0352197 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Číp, Ondřej - Čížek, Martin - Buchta, Zdeněk - Mikel, Břetislav - Lazar, Josef - Hrabina, Jan
Laser Measuring Gauge for Precise Transducer Calibrations in Nanometric Scale.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 582: 1-5. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA MŠMT(CZ) LC06007; GA AV ČR KAN311610701; GA MPO FR-TI1/241; GA ČR GA102/09/1276; GA ČR GAP102/10/1813
Institutional research plan: CEZ:AV0Z20650511
Keywords : nanometrology * sensors * distance measurements * measuring gauge
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191767 - 6.0352196 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Lazar, Josef - Číp, Ondřej - Čížek, Martin - Hrabina, Jan - Šerý, Mojmír
Interferometer Controlled Positioning for Nanometrology.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 525: 1-5. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA MŠMT(CZ) LC06007; GA AV ČR KAN311610701; GA MPO FR-TI1/241; GA ČR GA102/09/1276
Institutional research plan: CEZ:AV0Z20650511
Keywords : atomic force microscopy * interferometer controlled positioning
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191766 - 7.0352195 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Buchta, Zdeněk - Mikel, Břetislav - Lazar, Josef - Číp, Ondřej
Surface Diagnostics using Low-Coherence Interferometry and Colour Single CCD Camera.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 517: 1-6. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA ČR GP102/09/P293; GA ČR GP102/09/P630; GA MPO 2A-1TP1/127; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LC06007
Institutional research plan: CEZ:AV0Z20650511
Keywords : low-coherence interferometry * surface diagnostics * CCD camera * white-light fringe analysis
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191765 - 8.0352194 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Hrabina, Jan - Lazar, Josef - Číp, Ondřej - Čížek, Martin
Laser Source for Interferometry in Nanometrology.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 541: 1-6. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA MŠMT(CZ) LC06007; GA MŠMT 2C06012; GA MPO 2A-1TP1/127; GA MPO FT-TA3/133; GA MPO 2A-3TP1/113; GA ČR GA102/09/1276; GA ČR GA102/07/1179
Institutional research plan: CEZ:AV0Z20650511
Keywords : nanometrology * AFM microscopy * interferometry
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191764 - 9.0352193 CA BXXS
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications.
Ottawa: International ASET, 2010. ISBN 978-0-9867183-0-4 - 10.0352188 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Mikel, Břetislav - Buchta, Zdeněk - Lazar, Josef - Číp, Ondřej
DFB Laser Source at 760 nm Wavelength for Nanometrology.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 277: 1-8. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA MPO 2A-1TP1/127; GA MŠMT ED0017/01/01; GA ČR GP102/09/P293; GA ČR GP102/09/P630
Institutional research plan: CEZ:AV0Z20650511
Keywords : DFB laser diode * nanometrology * stabilization * tuneability
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191760