Search results

  1. 1.
    0437839 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
    Mikmeková, Eliška - Frank, Luděk
    Examination of Graphene with Very Slow Electrons.
    NANOCON 2014. 6th International conference proceedings. Ostrava: TANGER, 2014. ISBN 978-80-87294-55-0.
    [NANOCON 2014. International Conference /6./. Brno (CZ), 05.11.2014-07.11.2014]
    R&D Projects: GA TA ČR TE01020118; GA MŠMT(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : graphene * slow electrons * very low energy scanning electron microscopy * ultralow energy STEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0241324
     
     
  2. 2.
    0386397 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
    Pokorná, Zuzana - Frank, Luděk
    Imaging the local density of electronic states by very low energy electron reflectivity.
    Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 57-58. ISBN 978-80-87441-07-7.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
    Institutional support: RVO:68081731
    Keywords : very low energy scanning electron microscopy * reflectivity of slow electrons * crystalography orientation
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0215696
     
     
  3. 3.
    0352430 - ÚPT 2011 SG eng A - Abstract
    Frank, Luděk - Radlička, Tomáš - Konvalina, Ivo - Müllerová, Ilona
    Very low energy scanning electron microscopy.
    Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 98-99.
    [CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
    R&D Projects: GA MŠMT OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : very low energy scanning electron microscopy * cathode lens * BSE detector
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0191937
     
     
  4. 4.
    0340743 - ÚPT 2010 RIV JP eng J - Journal Article
    Pokorná, Zuzana - Frank, Luděk
    Mapping the Local Density of States by Very-Low-Energy Scanning Electron Microscope.
    Materials Transactions. Roč. 51, č. 2 (2010), s. 214-218. ISSN 1345-9678. E-ISSN 1347-5320
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : density of states * scanning low energy electron microscopy * aluminum * very-low-energy scanning electron microscopy * electron band structure
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 0.779, year: 2010
    http://www.jim.or.jp/journal/e/51/02/214.html
    Permanent Link: http://hdl.handle.net/11104/0183925
     
     


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