Search results
- 1.0423855 - ÚPT 2014 GR eng C - Conference Paper (international conference)
Pokorná, Zuzana - Knápek, Alexandr
Very low energy electrons as a tool for investigation of polycrystalline materials.
IMA 2013. 8th International Conference on Instrumental Methods of Analysis: Modern Trends and Applications. Book of Abstracts. Thessaloniki: Laboratory of Analytical Chemistry, Department of Chemical Engineering, AUTh, 2013, s. 146.
[IMA 2013. International Conference on Instrumental Methods of Analysis: Modern Trends and Applications /8./. Thessaloniki (GR), 15.09.2013-19.09.2013]
R&D Projects: GA TA ČR TE01020118
Institutional support: RVO:68081731
Keywords : very low energy electrons * investigation of polycrystalline materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0229907 - 2.0375383 - ÚPT 2012 RIV GB eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Mika, Filip - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Very low energy scanning electron microscopy in nanotechnology.
International Journal of Nanotechnology. Roč. 9, 8/9 (2012), s. 695-716. ISSN 1475-7435. E-ISSN 1741-8151
R&D Projects: GA MŠMT OE08012; GA MŠMT ED0017/01/01; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * very low energy electrons * cathode lens * grain contrast * strain contrast * imaging of participates * dopant contrast * very low energy STEM * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.087, year: 2012
Permanent Link: http://hdl.handle.net/11104/0208054 - 3.0353110 - ÚPT 2011 CZ eng K - Conference Paper (Czech conference)
Pokorná, Zuzana - Frank, Luděk
Vacuum level by very low energy electron reflectivity vacuum level by very low energy electron reflectivity.
Mikroskopie 2010. Nové Město na Moravě: Československá mikroskopická společnost, 2010 - (Frank, L.; Hozák, P.), s. 60. ISBN N.
[Mikroskopie 2010. Nové Město na Moravě (CZ), 17.02.2010-18.02.2010]
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : local density of states * SEM * reflectivity of very low energy electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0006220 - 4.0353051 - ÚPT 2011 CN eng A - Abstract
Konvalina, Ivo - Hovorka, Miloš - Fořt, Tomáš - Müllerová, Ilona
Optical and scanning electron microscopies in examination of ultrathin foils.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 224.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy electrons * laser confocal microscope * free-standing ultra thin films * very low energy transmission mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192399 - 5.0335265 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Horáček, Miroslav - Zobač, Martin - Vlček, Ivan
Electron beam induced current measurement on a specimen biased in a cathode lens.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 211-212. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : elektron beam induced current * SEM * very low energy electrons * cathode lens * specimen bias
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/77645.pdf
Permanent Link: http://hdl.handle.net/11104/0179775 - 6.0315081 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
Vlček, Ivan - Horáček, Miroslav - Zobač, Martin
Wien filter electron optical characteristics determining using shadow projection method.
[Určování optických vlastností Wienova filtru s využitím stínových metod.]
EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 551-552. ISBN 978-3-540-85154-7.
[EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : Wien filter * shadow method * very low energy electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0004852 - 7.0050995 - ÚPT 2007 cze K - Conference Paper (Czech conference)
Pokorná, Zuzana
Zobrazení lokální hustoty stavů pomocí odrazu velmi pomalých elektronů.
[Local density of states imaging using the reflection of very low energy electrons.]
PDS 2006 - Sborník prací doktorandů oboru Elektronová optika. Brno: ÚPT AV ČR, 2006, s. 49-50. ISBN 80-239-7957-4.
[PDS 2006. Brno (CZ), 19.12.2006]
R&D Projects: GA ČR GA202/04/0281
Keywords : local density of states * image contrast * electron reflectivity * very low energy electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0140997 - 8.0049020 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk
Methods of Direct Imaging of the Local Density of States with Electrons.
[Metody přímého zobrazování hustoty stavů pomocí elektronů.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 59-60. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : local density of states * image contrast * electron reflectivity * very low energy electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139517 - 9.0022401 - ÚPT 2006 RIV CH eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Romanovský, Vladimír - Müllerová, Ilona
Aquisition of signals from thin foils bombarded with very low energy electrons.
[Získávání signálů z tenkých folií po dopadu elektronů s velmi nízkou energií.]
Proceedings - Microscopy Conference 2005 - Dreiländertagung /6./. Villigen: Paul Scherrer Institute, 2005, s. 43. ISBN N. ISSN 1019-6447.
[Dreiländertagung Microscopy Conference (MC 2005). Davos (CH), 28.08.2005-02.09.2005]
R&D Projects: GA AV ČR KJB2065405
Keywords : very low energy electrons * scanning electron microscope * transmitted electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0111141