Search results
- 1.0395127 - ÚPT 2014 RIV GB eng J - Journal Article
Mikmeková, Eliška - Bouyanfif, H. - Lejeune, M. - Müllerová, Ilona - Hovorka, Miloš - Unčovský, M. - Frank, Luděk
Very low energy electron microscopy of graphene flakes.
Journal of Microscopy. Roč. 251, č. 2 (2013), s. 123-127. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : graphene * very low energy STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.150, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225233 - 2.0383741 - ÚPT 2013 RIV NL eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
A method of imaging ultrathin foils with very low energy electrons.
Ultramicroscopy. Roč. 119, AUG (2012), s. 79-81. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : very low energy STEM * penetration of very slow electrons * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.470, year: 2012
Permanent Link: http://hdl.handle.net/11104/0213588 - 3.0375383 - ÚPT 2012 RIV GB eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Mika, Filip - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Very low energy scanning electron microscopy in nanotechnology.
International Journal of Nanotechnology. Roč. 9, 8/9 (2012), s. 695-716. ISSN 1475-7435. E-ISSN 1741-8151
R&D Projects: GA MŠMT OE08012; GA MŠMT ED0017/01/01; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * very low energy electrons * cathode lens * grain contrast * strain contrast * imaging of participates * dopant contrast * very low energy STEM * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.087, year: 2012
Permanent Link: http://hdl.handle.net/11104/0208054 - 4.0358595 - ÚPT 2012 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Konvalina, Ivo - Mikmeková, Šárka - Müllerová, Ilona
Very low energy scanning electron microscopy.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 46-54. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * low energy electrons * cathode lens * very low energy STEM * grain contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196580 - 5.0352509 - ÚPT 2011 RIV JP eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
Examination of Very Thin Free-standing Films with Slow Electrons.
Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 45-48. ISBN 978-4-9903248-2-7.
[JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama (JP), 12.09.2010-15.09.2010]
R&D Projects: GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy STEM * penetration of very slow electrons * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192001 - 6.0336638 - ÚPT 2010 RIV CZ cze L - Prototype, f. module
Müllerová, Ilona - Hovorka, Miloš - Klein, Pavel
Polovodičový detektor pomalých elektronů prošlých vzorkem.
[Semiconductor detector of slow electrons transmitted through the specimen.]
Internal code: 5511-1 ; 2009
Technical parameters: Detektor velmi pomalých elektronů prošlých vzorkem se záběrem celé vyzařovací charakteristiky +-90 deg od normály povrchu, rozměr detektoru 5x5 mm, PIN struktura, 100% sběrová účinnost, zesílení až 3000x i při energii elektronů pod 1 eV.
Economic parameters: Funkční vzor je možné zavést do každého rastrovacího mikroskopu se vzorkem na vysokém potenciálu a realizovat tak režim STEM s velmi nízkou energií.
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy STEM * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0180830