Search results
- 1.0551651 - FZÚ 2022 RIV CZ cze J - Journal Article
Palatinus, Lukáš - Kratochvíl, B.
Elektronová difrakce – nový nástroj pro řešení krystalové struktury látek.
[Electron diffraction – a new tool for crystal structure solutions.]
Chemické listy. Roč. 115, č. 7 (2021), s. 368-374. ISSN 0009-2770. E-ISSN 1213-7103
R&D Projects: GA ČR(CZ) GX21-05926X
Institutional support: RVO:68378271
Keywords : transmission electron microscope * 3D electron diffraction * structural analysis * nanocrystal * molecular crystal
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 0.356, year: 2021
Method of publishing: Open access
http://www.chemicke-listy.cz/ojs3/index.php/chemicke-listy/article/view/3879/3795
Permanent Link: http://hdl.handle.net/11104/0326894 - 2.0536670 - ÚPT 2021 RIV CZ cze O - Others
Krátký, Stanislav - Materna Mikmeková, Eliška - Fořt, Tomáš - Radlička, Tomáš - Sháněl, O.
Vývoj a testování fázových destiček.
[Development and testing of phase plates.]
2020
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : transmission electron microscope * phase plates * silicon nitride * charging * EELS
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314406 - 3.0536669 - ÚPT 2021 RIV CZ cze O - Others
Radlička, Tomáš - Sháněl, O.
Optimalizace zobrazení pro HR-STEM.
[HR-STEM imaging optimization.]
2020
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning transmission electron microscope * Ronchigram * aberration analysis 9) Hlavní obor smluvního výzkumu dle číselníku CEP (RIV)
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314405 - 4.0536668 - ÚPT 2021 RIV CZ cze O - Others
Radlička, Tomáš - Sháněl, O.
Optimalizační algoritmus pro HR-STEM s nekorigovanou sférickou vadou.
[HR-STEM optimizing algorithm for Cs non-corrected TEM.]
2020
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning transmission electron microscope * Ronchigram * aberration analysis
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314404 - 5.0347839 - FZÚ 2011 RIV DE eng J - Journal Article
Bronsveld, P.C.P. - Mates, Tomáš - Fejfar, Antonín - Kočka, Jan - Rath, J.K. - Schropp, R.E.I.
High hydrogen dilution and low substrate temperature cause columnar growth of hydrogenated amorphous silicon.
Physica Status Solidi A. Roč. 207, č. 3 (2010), s. 525-529. ISSN 1862-6300. E-ISSN 1862-6319
R&D Projects: GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510
Institutional research plan: CEZ:AV0Z10100521
Keywords : hydrogenated amorphous silicon * columnar growth * cross-sectional transmission electron microscope (X-TEM]
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.458, year: 2010
http://dx.doi.org/10.1002/pssa.200982847
Permanent Link: http://hdl.handle.net/11104/0188523 - 6.0340584 - FZÚ 2010 RIV US eng J - Journal Article
Lidbaum, H. - Rusz, Ján - Liebig, A. - Hjörvarsson, B. - Oppeneer, P.M. - Coronel, E. - Eriksson, O. - Leifer, K.
Quantitative magnetic information from reciprocal space maps in Transmission Electron Microscopy.
Physical Review Letters. Roč. 102, č. 3 (2009), 037201/1-037201/4. ISSN 0031-9007. E-ISSN 1079-7114
Institutional research plan: CEZ:AV0Z10100520
Keywords : transmission electron microscope * dichroism * sum rules * magnetic moment * EMCD * ELNES
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 7.328, year: 2009
http://prl.aps.org/abstract/PRL/v102/i3/e037201
Permanent Link: http://hdl.handle.net/11104/0183796 - 7.0335296 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Fořt, Tomáš - Frank, Luděk
Transmission of Electrons through Thin Films by Scanning Low Energy Electron Microscopy.
Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009 - (Pokorná, Z.; Mika, F.), s. 22. ISBN 978-80-254-4535-8.
[CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./. Brno (CZ), 10.08.2009-14.08.2009]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : transmission electron microscope * scanning low energy electron microscopes
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0179802 - 8.0041137 - FZÚ 2007 RIV US eng J - Journal Article
Bronsveld, P.C.P. - Rath, J.K. - Schropp, R.E.I. - Mates, Tomáš - Fejfar, Antonín - Rezek, Bohuslav - Kočka, Jan
Internal structure of mixed phase hydrogenated silicon thin films made at 39 degrees.
[Vnitřní struktura hydrogenovaných křemíkových vrstev se smíšenou fází připravených při 39 st. Celsia.]
Applied Physics Letters. Roč. 89, - (2006), 051922/1-051922/3. ISSN 0003-6951. E-ISSN 1077-3118
Institutional research plan: CEZ:AV0Z10100521
Keywords : transmission electron microscope * atomic force microscope * silicon films
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.977, year: 2006
Permanent Link: http://hdl.handle.net/11104/0134706