Search results
- 1.0508751 - ÚPT 2020 RIV CH eng J - Journal Article
Konvalina, Ivo - Mika, Filip - Krátký, Stanislav - Materna Mikmeková, Eliška - Müllerová, Ilona
In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM.
Materials. Roč. 12, č. 14 (2019), č. článku 2307. E-ISSN 1996-1944
R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR TE01020233; GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : band-pass filter of signal electrons * SE detection * trajectory simulations
OECD category: Electrical and electronic engineering
Impact factor: 3.057, year: 2019
Method of publishing: Open access
https://www.mdpi.com/1996-1944/12/14/2307/htm
Permanent Link: http://hdl.handle.net/11104/0299576 - 2.0481585 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mika, Filip - Müllerová, Ilona
STEM modes in SEM – simulations and experiments.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 140-141. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : STEM detector * trajectory simulations * cathode lens * collection efficiency
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0277129 - 3.0420975 - ÚPT 2014 DE eng C - Conference Paper (international conference)
Konvalina, Ivo - Müllerová, Ilona
Collection of signal electrons in Low Energy SEM.
Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 327-328.
[Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
R&D Projects: GA MŠMT EE2.4.31.0016
Institutional support: RVO:68081731
Keywords : signal collection * low energy SEM * trajectory simulations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0227433